
Introduction
1.1 Library Description
Samsung ASIC
1-1
STD130
1.1
Library
Description
STD130 is Samsung's next generation Standard Cell library containing standard
cells implemented in Samsung's 0.18
μ
m, L18 process technology. Samsung's
L18 process uses 4 to 6 metal interconnect layers. The STD130 library contains
diverse application specific digital and analog IP for System-on-Chip (SoC)
applications. Samsung provides a full range of cells within the STD130 library to
address the challenges of designing and producing ultra low power as well as
high density devices that take advantage of SoC integration. With its reduced
power dissipation and high density, STD130 can help reduce system cost for high
performance applications such as HDD, Networking, and Displays.
The STD130 library supports gate counts of up to 23 million gates with 80%
usability.Gate delay is 30% better thanSamsung's STD110 0.25
μ
m library. Logic
and memory densities are respectively 2.6 and 3 times better than STD110.
The STD130 library also contains fully user configurable complied memories for
high-density or low-power applications. To get higher yield for SoC designs,
Samsung also contains the repairable compiled memory with row redundant
elements.
The STD130 library also supports a wide range of I/O interface voltages and
standards. I/O cells that drive 1.8V, 2.5V, and 3.3V are available as are 3.3V and
5V tolerant I/Os. Available I/O standards include LVTTL, LVCMOS, PCI, PCI-X,
OSC, AGP, PECL, HSTL, SSTL2, GTLp, LVDS, and USB 1.1.
To better support SoC design, a robust collection of digital and analog IP cores
are available. Digital cores include the ARM7TDMI, ARM9TDMI, ARM920T, and
ARM940T from ARM Ltd., as well as the Teak and TeakLite DSP cores from the
DSP Group. Analog cores include ADCs, DACs, CODECs, and PLLs with various
bit configurations and frequency ranges. A thick oxide process option allows for
high resolution operation of analog cores with a 3.3V power supply.
In addition, the STD130 library supports communication and data transmission
cores such as USB 1.1, IEEE1284, IEEE1394 link controller, UART, PCI
controller, PCMCIA controller and 10/100 ethernet MAC.
Samsung's design methodology offers a comprehensive timing driven design
flow including automated time budgeting, tight floor plan synthesis integration,
powerful timinganalysis, and timing driven layout. Our advanced characterization
flow provides accurate timing data and robust delay models for L18, our 0.18
μ
m
very deep sub-micron process technology. Static verification methods, such as
static timing analysis and formal equivalence checking, provide an effective
verification methodology with a variety of simulators. Samsung's Design-for-Test
(DFT) methodology supports full and partial scan chain design, BIST, JTAG
boundary scan, and Built-in-Redundancy-Analysis (BIRA) for reparable SRAM.
Samsung provides a full set of test ready IP cores with an efficient core test
integration methodology.