參數(shù)資料
型號: 5962R0722402VYC
廠商: ATMEL CORP
元件分類: 微控制器/微處理器
英文描述: SPECIALTY MICROPROCESSOR CIRCUIT, PQFP256
封裝: QFP-256
文件頁數(shù): 125/155頁
文件大?。?/td> 4139K
代理商: 5962R0722402VYC
AT697F PRELIMINARY INFORMATION
71
7703D–AERO–12/09
PR
ELI
MINA
R
Y
IN
FOR
M
AT
IO
N
It is used to test connections between components at board level. Components output pins are
controlled by boundary scan register during Capture DR on the rising edge of TCK.
SAMPLE/PRELOAD
This instruction is binary coded "001"
It is used to get a snapshot of the normal operation by sampling I/O states during Capture DR on
the rising edge of TCK. It allows also to preload a value on the output latches during Update DR
on falling edge of TCK. It do not modify system behaviour.
IDCODE
This instruction is binary coded "111"
Value of the IDCODE is loaded during Capture DR.
Test Data
Registers
The following data registers are supported in the AT697 TAP:
Bypass Register
Bypass register containing a single shift register stage is connected between TDI and TDO.
Figure 45. Bypass Register Cell
D
from TDI
to TDO
Clock DR
Shift DR
&
Device ID register
Device ID register is a read only 32-bit register.
It is connected between TDI and TDO.
Figure 46. Device ID Register
Vers.
Part ID
Manufacturer’s ID
Const.
0
1
11
12
27
28
31
0001
1011 . 0110 . 0100 . 0101
000 . 0101 . 1000
1
ID. register value: 0x 1b64 50b1
Field Definitions:
[31:28]: Vers - Version number - 0x1
[27:12]: Part ID - Represent part number as assigned by Vendor- 0x b645
[11:01]: Manufacturer’s ID - Represent manufacturer’s ID as per JEDEC - 0x 058
[0]: Const - Constant tied to logic ’1’.
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