參數(shù)資料
型號: 5962R0722402VYC
廠商: ATMEL CORP
元件分類: 微控制器/微處理器
英文描述: SPECIALTY MICROPROCESSOR CIRCUIT, PQFP256
封裝: QFP-256
文件頁數(shù): 122/155頁
文件大?。?/td> 4139K
代理商: 5962R0722402VYC
AT697F PRELIMINARY INFORMATION
69
7703D–AERO–12/09
PR
ELI
MINA
R
Y
IN
FOR
M
AT
IO
N
TAP Architecture
The TAP implemented in the AT697 consists of a TAP interface, a TAP controller, plus a number
of shift registers including an instruction register (IR) and some registers .
Figure 43. AT697 TAP Architecture
TCK
Reset
TRST
TAP
Controller
TDO
TDI
TMS
TCK
Clock DR
Shift DR
Update DR
Clock IR
Shift IR
Update IR
EN
EN
D
Q
0
1
. . . .
Select
Ena TDO
Design-Specific Data
Mux
. . . .
. . . . . . . . .
Test
Data Registers
Instruction Decode
Instruction Register
Bypass Register
Boundary Scan Register
Device ID Register
TAP Controller
The TAP controller is a synchronous finite state machine (FSM) which controls the sequence of
operations of the JTAG test circuitry, in response to changes at the JTAG bus. (Specifically, in
response to changes at the TMS input with respect to the TCK input.)
The TAP controller FSM implements the state (16 states) diagram as detailed in the following
diagram. The IR is a 3-bit register which allows a test instruction to be shifted into the AT697.
The instruction selects the test to be performed and the test data register to be accessed.
Although any number of loops may be supported by the TAP, the finite state machine in the TAP
controller only distinguishes between the IR and a DR. The specific DR can be decoded from the
instruction in the IR.
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