參數(shù)資料
型號(hào)： DS33ZH11
廠商： MAXIM INTEGRATED PRODUCTS INC
元件分類： 網(wǎng)絡(luò)接口
英文描述： Ethernet Mapper
中文描述： DATACOM, NETWORK INTERFACE SUPPORT CIRCUIT, PBGA100
封裝： 10 X 10 MM, 1.41 MM HEIGHT, 0.80 MM PITCH, CSBGA-100
文件頁數(shù)： 164/169頁
文件大?。?/td> 1049K
代理商： DS33ZH11
DS33Z11 Ethernet Mapper
164 of 169
Table 12-1 Instruction Codes for IEEE 1149.1 Architecture
INSTRUCTION
SAMPLE:PRELOAD
BYPASS
EXTEST
CLAMP
HIGHZ
IDCODE
SELECTED REGISTER
Boundary Scan
Bypass
Boundary Scan
Bypass
Bypass
Device Identification
INSTRUCTION CODES
010
111
000
011
100
001
12.2.1 SAMPLE:PRELOAD
This is a mandatory instruction for the IEEE 1149.1 specification. This instruction supports two functions. The
digital I/Os of the device can be sampled at the boundary scan register without interfering with the normal
operation of the device by using the Capture-DR state. SAMPLE:PRELOAD also allows the device to shift data
into the boundary scan register via JTDI using the Shift-DR state.
12.2.2 BYPASS
When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO through the
one-bit bypass test register. This allows data to pass from JTDI to JTDO not affecting the device’s normal
operation.
12.2.3 EXTEST
This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the instruction
register, the following actions occur. Once enabled via the Update-IR state, the parallel outputs of all digital output
pins are driven. The boundary scan register is connected between JTDI and JTDO. The Capture-DR will sample
all digital inputs into the boundary scan register.
12.2.4 CLAMP
All digital outputs of the device will output data from the boundary scan parallel output while connecting the bypass
register between JTDI and JTDO. The outputs will not change during the CLAMP instruction.
12.2.5 HIGHZ
All digital outputs of the device are placed in a high-impedance state. The BYPASS register is connected between
JTDI and JTDO.
12.2.6 IDCODE
When the IDCODE instruction is latched into the parallel instruction register, the identification test register is
selected. The device identification code is loaded into the identification register on the rising edge of JTCLK
following entry into the Capture-DR state. Shift-DR can be used to shift the identification code out serially via
JTDO. During Test-Logic-Reset, the identification code is forced into the instruction register’s parallel output. The
ID code will always have a ‘1’ in the LSB position. The next 11 bits identify the manufacturer’s JEDEC number and
number of continuation bytes followed by 16 bits for the device and 4 bits for the version.
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