參數(shù)資料
型號(hào): ADUC7032BSTZ-88-RL
廠商: Analog Devices Inc
文件頁數(shù): 16/120頁
文件大?。?/td> 0K
描述: IC MCU 96K FLASH DUAL 48LQFP
標(biāo)準(zhǔn)包裝: 2,000
系列: MicroConverter® ADuC7xxx
核心處理器: ARM7
芯體尺寸: 16/32-位
速度: 20.48MHz
連通性: LIN,SPI,UART/USART
外圍設(shè)備: POR,PSM,溫度傳感器,WDT
輸入/輸出數(shù): 9
程序存儲(chǔ)器容量: 96KB(48K x 16)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 1.5K x 32
電壓 - 電源 (Vcc/Vdd): 3.5 V ~ 18 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 2x16b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 105°C
封裝/外殼: 48-LQFP
包裝: 帶卷 (TR)
ADuC7032-8L
Rev. A | Page 112 of 120
ADuC7032-8L ON-CHIP DIAGNOSTICS
The ADuC7032-8L integrates multiple diagnostic support
circuits on-chip. These circuits allow the device to test core
digital functionality, and analog front-end and high voltage I/O
ports in-circuit.
ADC DIAGNOSTICS
Internal Test Voltage
The current channel can be configured to convert on an
internal 8.3 mV test voltage. On any gain range, the result
should be within ±2% of the expected result.
Internal Short Mode
The current and voltage input channels can also be shorted
internally. Converting on the internal short allows an
assessment of the internal ADC noise.
Internal Current Sources
Internal current sources can also be enabled on both current
and temperature channels. These current sources can be used
to determine external short-circuit or open-circuit conditions
in both external shunt or temperature sensor configurations.
HIGH VOLTAGE I/O DIAGNOSTICS
High Voltage I/O Readback
All high voltage I/O pins are supported with readback capa-
bility, which allows the detection of external short conditions.
High Voltage Current Detection
All high voltage I/O pins also have a high current detection
capability, allowing high-side connections to VBAT to be
detected and controlled.
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