
TSE Transmission Switch Element Datasheet
Released
Proprietary and Confidential to PMC-Sierra, Inc., and for its Customers’ Internal Use
Document ID: PMC-1991258, Issue 7
136
After the CSUs have locked, the transmit FIFOs must be re-centered since they will have suffered
over-run or under-run conditions while the CSUs were not locked. To re-center the FIFOs, write
a 1 to the CENTER bit in all 64 of the T8DE Control and Status registers (0NB0h, 0NB8h,
0NC0h, and 0NC8h where N=0 to F).
Enable all interrupts on the device by writing registers as follows:
CSTR 1 – 4 Addr 0021h, 0025h, 0029h, and 002Dh to ---------------1b
SSWT Addr 0043h to ---------------1b
R8FA 1- 64 Addr 0N80h 0N88h, 0N90h, 0N08h (N=1 to 15) to --------1111----b
ITSE 1- 16 Addr 0NA2h (N=0 to 15)to 00001h
ETSE 1- 16 Addr 0NAAh (N=0 to 15)to 00001h
T8DE Addr 0NB0h, 0NB8h, 0NC0h, 0NC8h to -----------1----b
12.7 Interrupt Service Routine
The TSE will assert INTB to logic 0 when a condition that is configured to produce an interrupt
occurs. To find which condition caused this interrupt to occur, the procedure outlined below
should be followed:
Read the registers 0003H – 000EH to find the functional block(s) which caused the interrupt.
Find the register address of the corresponding block that caused the interrupt and read its
Interrupt Status registers. The interrupt functional block and interrupt source identification
register bits from step 1 are cleared once these register(s) have been read and the interrupt(s)
identified.
Service the interrupt(s).
If the INTB pin is still logic 0, then there are still interrupts to be serviced and steps 1 to 3 need to
be repeated. Otherwise, all interrupts have been serviced. Wait for the next assertion of INTB.
12.8 Interpreting the Status of Receive Decoders
The receive decoder blocks (R8FA) produce interrupts based on four receiver conditions or
events: OCA (Out of Character Alignment), OFA (Out of Frame Alignment), FUO (FIFO
Underrun/Overrun) and LCV (Line Code Violation). Understanding the relationships between
these conditions can help to diagnose device status. These conditions have the following inter-
relationships: