參數(shù)資料
型號: GCIXF1002EDT
英文描述: Controller Miscellaneous - Datasheet Reference
中文描述: 控制器雜項-數(shù)據(jù)表參考
文件頁數(shù): 121/128頁
文件大?。?/td> 1262K
代理商: GCIXF1002EDT
Intel
IXF1002 Dual Port Gigabit Ethernet Controller
Datasheet
121
Joint Test Action Group – Test Logic
A
This appendix describes the joint test action group (JTAG) test logic and the associated registers.
A.1
General Description
JTAG test logic supports testing, observation, and modification of circuit activity during normal
operation of the components. The IXF1002 supports the IEEE Standard 1149.1 Test Access Port
and Boundary Scan Architecture. The IXF1002 JTAG test logic allows boundary scan to be used to
test both the device and the board it is installed in. The JTAG test logic consists of the following
four signals to serially interface within the IXF1002:
tck
JTAG clock
tdi
Test data and instructions in
tdo
Test data and instructions out
tms
Test mode select
Note:
If JTAG test logic is not used, the tck pin should be connected to
0
, and both the tms and tdi pins
should be connected to
1
. The tdo signal should remain unconnected.
Note:
If JTAG logic is used, a 1149.1 ring is created by connecting one device
s tdo pin to another
device
s tdi pin and so on, to create a serial chain of devices. In this application, the IXF1002
receives the same tck and tms signals as the other devices. The entire 1149.1 ring is connected to
either a motherboard test connector for test purposes or to a resident 1149.1 controller.
A.1.1
Test Access Port Controller
The test access port (TAP) controller interprets IEEE P1149.1 protocols received on the tms pin.
The TAP controller generates clocks and control signals to control the operation of the test logic.
The TAP controller consists of a state machine and a control dispatch logic. The IXF1002 fully
implements the TAP state machine as described in the IEEE P1149.1 Standard.
A.2
Registers
In JTAG test logic, three registers are implemented in the IXF1002:
Instruction register
Bypass register
Boundary-scan register
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