參數(shù)資料
型號： AMIS-53000-M
英文描述： Frequency Agile Transceiver
中文描述： 捷變頻收發(fā)器
文件頁數(shù)： 95/99頁
文件大小： 2638K
代理商： AMIS-53000-M
AMIS-53000
Frequency Agile Transceiver
Data Sheet
9.2.12. Digital Test MUX C
Table 117: Digital Test MUX C - 0X4D [77]
Bit
Test Pin
Comment
1111
1110
1101
Encoder in
Decoder in
EE BIST good
0111
0110
0101
RAMBist bad
EE BIST done
EE BIST bad
1100
EE low voltage
detect
0100
Busy
1011
1010
1001
MUX to
Data SSN
CPENA
ROM BIST done
ROM BIST bad
0011
0010
0001
Instruction enable
Bandgap power down
XTAL
Data SSN normal
mode
7:4
1111 - 0000
1000
RAM BIST done
0000
3:0
1111- 0000
9.2.13. Digital Test Mode A
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.14. Digital Test Mode B
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.15. Digital Test Mode C
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.16. Digital Test Mode D
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.17. Memory Test Mode Address
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.18. Memory Test Mode Data
This register is used for factory testing of the AMIS-53000 and has no user functions.
95
AMI Semiconductor
– Aug. 05, Rev. 1.0
www.amis.com
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