參數(shù)資料
型號(hào): AMDK86
英文描述: AMD K86 - AMD K86 Family BIOS and Software Tools Developers Guide
中文描述: AMD的K86 - AMD的K86系列BIOS和軟件工具開發(fā)人員指南
文件頁數(shù): 33/144頁
文件大小: 2179K
代理商: AMDK86
AMD-K5 Processor
21
21062E/0—June 1997
AMD K86 Family BIOS and Software Tools Developers Guide
Preliminary Information
AMD-K5 Processor Test and Debug
The AMD-K5 processor has the following modes in which
processor and system operation can be tested or debugged:
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Hardware Configuration Register (HWCR)
—The HWCR is a
MSR that contains configuration bits that enable cache,
branch tracing, debug, and clock control
functions.
Built-In Self-Test (BIST)
—Both normal and test access port
(TAP) BIST.
Output-Float Test
—A test mode that causes the AMD-K5
processor to float all of its output and bidirectional signals.
Cache and TLB Testing
—The Array Access Register (AAR)
supports writes and reads to any location in the tag and data
arrays of the processor’s on-chip caches and TLBs.
Debug Registers
—Standard 486 debug functions with an
I/O-breakpoint extension.
Branch Tracing
—A pair of special bus cycles can be driven
immediately after taken branches to specify information
about the branch instruction and its target. The Hardware
Configuration Register (HWCR) provides support for this
and other debug functions.
Functional Redundancy Checking
—Support for real-time
testing that uses two processors in a master-checker
relationship.
Test Access Port (TAP) Boundary-Scan Testing
—The JTAG
test access functions defined by the
IEEE Standard Test
Access Port and Boundary-Scan Architecture (IEEE
1149.1-1990)
specification.
Hardware Debug Tool (HDT)
—The hardware debug tool
(HDT), sometimes referred to as the debug port or Probe
mode, is a collection of signals, registers, and processor
microcode enabled when external debug logic drives R/S
Low or loads the AMD-K5 processor’s Test Access Port
(TAP) instruction register with the USEHDT instruction.
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