參數(shù)資料
型號(hào): 28F128J3A
廠商: Intel Corp.
英文描述: 3 Volt Intel StrataFlash Memory(3 V 128M位Strata閃速存儲(chǔ)器)
中文描述: 3伏特英特爾StrataFlash存儲(chǔ)器(128兆位3伏地層的閃速存儲(chǔ)器)
文件頁(yè)數(shù): 50/58頁(yè)
文件大?。?/td> 574K
代理商: 28F128J3A
28F128J3A, 28F640J3A, 28F320J3A
44
PRODUCT PREVIEW
NOTE:
AC test inputs are driven at V
(2.4 V
TTL
) for a Logic "1" and V
OL
(0.45 V
TTL
) for a Logic "0." Input timing
begins at V
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10%
to 90%) <10 ns.
NOTE:
AC test inputs are driven at V
CCQ
for a Logic "1" and 0.0 V for a Logic "0." Input timing begins, and output
timing ends, at
V
CCQ
/2 V (50% of V
CCQ
). Input rise and fall times (10% to 90%) < 5 ns.
NOTE:
C
L
Includes Jig Capacitance
Figure 15. Transient Input/Output Reference Waveform for V
CCQ
= 5.0 V ± 10%
Output
0.8
Test Points
Input
2.0
2.0
0.8
2.4
0.45
Figure 16. Transient Input/Output Reference Waveform for V
CCQ
= 3.0 V–3.6 V or
V
CCQ
= 2.7 V–3.6 V
Output
Test Points
Input V
CCQ
/2
0.0
V
CCQ
V
CCQ
/2
Figure 17. Transient Equivalent Testing Load Circuit
Device
Under Test
Out
R
L
= 3.3 k
1N914
1.3V
C
L
Test Configuration
C
L
(pF)
V
CCQ
= 5.0 V
±
10%; V
CC
= 2.7 V
3.6 V
30
V
CCQ
= V
CC
= 3.0 V
3.6 V
30
V
CCQ
= V
CC
= 2.7 V
3.6 V
30
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