Datasheet
41
Pentium
III Processor for the SC242 at 450 MHz to 1.0 GHz
3.2.2
Overshoot/Undershoot Pulse Duration
Overshoot/Undershoot Pulse duration describes the total time an overshoot/undershoot event
exceeds the Overshoot/Undershoot Reference Voltage (
V
OS_REF
= 1.635 V). The total time could
encompass several oscillations above the Reference Voltage. Multiple overshoot/undershoot pulses
within a single overshoot/undershoot event may need to be measured to determine the total Pulse
Duration.
Note:
Oscillations below the Reference Voltage can not be subtracted from the total Overshoot/
Undershoot Pulse Duration.
Note:
Multiple Overshoot/Undershoot events occurring within the same clock cycle must be considered
together as one event. Using the worst case Overshoot/Undershoot Magnitude, sum together the
individual Pulse Durations to determine the total Overshoot/Undershoot Pulse Duration for that
total event.
3.2.3
Overshoot/Undershoot Activity Factor
Activity Factor (AF) describes the frequency of overshoot (or undershoot) occurrence relative to a
clock. Since the highest frequency of assertion of an AGTL+ or a CMOS signal is every other
clock, an AF = 1 indicates that the specific overshoot (or undershoot) waveform occurs EVERY
OTHER clock cycle. Thus, an AF = 0.01 indicates that the specific overshoot (or undershoot)
waveform occurs one time in every 200 clock cycles.
The Overshoot/Undershoot Specifications (
Table 20
through
Table 22
) show the Maximum Pulse
Duration allowed for a given Overshoot/Undershoot Magnitude at a specific Activity Factor. Each
Table entry is independent of all others, meaning that the Pulse Duration reflects the existence of
Overshoot/Undershoot Events of that Magnitude ONLY. A platform with an overshoot/undershoot
that just meets the Pulse Duration for a specific Magnitude where the AF < 1, means that there can
be NO other Overshoot/Undershoot events, even of lesser Magnitude (note that if AF = 1, then the
event occurs at all times and no other events can occur).
Note:
Overshoot (rising edge) and undershoot (falling edge) conditions are separate and their impact
must be determined independently.
Note:
Activity factor for AGTL+ signals is referenced to BCLK frequency.
Note:
Activity factor for CMOS signals is referenced to PICCLK frequency.