參數(shù)資料
型號： ARM610
廠商： Zarlink Semiconductor Inc.
英文描述： General purpose 32-bit microprocessor
中文描述： 通用32位微處理器
文件頁數(shù)： 16/173頁
文件大?。?/td> 897K
代理商： ARM610
Signal Description
ARM610 Data Sheet
2-4
Notes
1
When output pads are placed in the high impedance state for long periods,
take care that they do not float to an undefined logic level, as this can dissipate
power, especially in the pads.
2
Although the input pads have TTL thresholds, and will correctly interpret a TTL
level input, note that unless all inputs are driven to the voltage rails, the input
circuits will consume power.
TEST
OUT[2:0]
OCZ
Test bus output. This bus is used for off-board testing of the device. When
the device is fitted to a circuit and all the
LOW, these three outputs will be driven LOW. Note that these pins may not
be tristated, except via the JTAG test port.
TESTIN[16:0]
pins are driven
TCK
IT
Test interface reference Clock. This times all the transfers on the JTAG test
interface.
TDI
IT
Test interface data input. Note this pin does NOT have an internal pullup
resistor.
TDO
OCZ
Test interface data output. Note this pin does NOT have an internal pullup
resistor.
TMS
IT
Test interface mode select. Note this pin does NOT have an internal pullup
resistor.
VDD
Positive supply. 16 pins are allocated to
VDD
in the 160 PQFP package.
VSS
Ground supply. 16 pins are allocated to
VSS
in the 160 PQFP package.
Name
Type
Description
Table 2-1: Signal descriptions (Continued)
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