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| 型號： | MC92610VF |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PBGA324 |
| 封裝： | 19 X 19 MM, 1.76 MM HEIGHT, 1 MM PITCH, PLASTIC, MS-034AAG-1, MAPBGA-324 |
| 文件頁數(shù)： | 27/104頁 |
| 文件大?。?/td> | 1595K |
| 代理商： | MC92610VF |
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MOTOROLA
Chapter 2. Transmitter
2-9
Functional Description
2.3.1.9
Loop-Back Test Mode
A special loop-back mode is supported for test. asserting LBE high enables loop-back
mode causing the data being driven on the link outputs to be looped back to the input
amplifier of the link’s receiver.
Loop-back data can be routed through either of the two output drivers. The path taken is
controlled by the XCVR_x_RSEL signal. When XCVR_x_RSEL is low, data loops back
through the primary driver (XLINK_x0_P / XLINK_x0_N), and when XCVR_x_RSEL is
high, data loops back through the redundant driver (XLINK_x1_P / XLINK_x1_N).
Loop-back data is processed the same as normally received data. Loop-back enables
at-speed self-test to be implemented for production test and for in-system self-test. The
loop-back signals are electrically isolated from the link output signals. Therefore, if the
outputs are shorted, or otherwise restricted, the loop-back signals still operate normally.
When in loop-back mode, the LBOE signal controls the action of the link output signals.
When LBOE is low, the link outputs are undriven and are high-impedance. When LBOE is
high, the link output signals operate normally.
LBOE has no affect on the operation of the device when LBE is low.
See Section 5.2 for more information on system accessible test modes.
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Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
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