參數(shù)資料
型號(hào): 28F016XS
廠商: Intel Corp.
英文描述: 16-Mbit Synchronous Flash Memory(16M位同步閃速存儲(chǔ)器)
中文描述: 16兆位同步閃存(1,600位同步閃速存儲(chǔ)器)
文件頁(yè)數(shù): 26/54頁(yè)
文件大?。?/td> 830K
代理商: 28F016XS
28F016XS FLASH MEMORY
E
26
5.3
Transient Input/Output Reference Waveforms
TEST POINTS
INPUT
OUTPUT
2.0
0.8
0.8
2.0
2.4
0.45
0532_07
AC test inputs are driven at V
(2.4 VTTL) for a Logic
“1” and V
(0.45 VTTL) for a Logic “0.” Input timing begins at V
IH
(2.0 VTTL) and V
IL
(0.8 VTTL). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10% to 90%) <10 ns.
Figure 8. Transient Input/Output Reference Waveform (V
CC
= 5.0V ± 5%)
for Standard Testing Configuration
(1)
TEST POINTS
INPUT
OUTPUT
1.5
3.0
0.0
1.5
0532_08
AC test inputs are driven at 3.0V for a Logic
“1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
Figure 9. Transient Input/Output Reference Waveform (V
= 3.3V ± 5%)
High Speed Reference Waveform
(2)
(V
CC
= 5.0V ± 5%)
NOTES:
1.
2.
Testing characteristics for 28F016XS-20 at 5V V
CC
.
Testing characteristics for 28F016XS-15 at 5V V
CC
and 28F016XS-20/28F016XS-25 at 3.3V V
CC
.
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