參數(shù)資料
型號: SBPH400-3
廠商: 意法半導體
英文描述: IEEE1394 3-Port 400Mbps Physical Layer
中文描述: IEEE1394連接3端口400Mbps的物理層
文件頁數(shù): 34/43頁
文件大?。?/td> 285K
代理商: SBPH400-3
34/43
SBPH400-3
Some pins on the SBPH400 have different functionality in various test modes. Table 3.2
identifies these pins for ease of reference, but the full description of the associate functions is
not included in this data sheet.
SCLK
TPA1
TPA1#
TPB1
TPB1#
TPA2
TPA2#
TPB2
TPB2#
TPA3
TPA3#
TPB3
TPB3#
TPBIAS1
TPBIAS2
TPBIAS3
60
1
2
3
4
7
8
9
10
16
17
18
19
5
11
20
O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
O
O
O
Clock to Link device - 49.152 MHz
Positive signal of cable pair A of port 1
Negative signal of cable pair A of port 1
Positive signal of cable pair B of port 1
Negative signal of cable pair B of port 1
Positive signal of cable pair A of port 2
Negative signal of cable pair A of port 2
Positive signal of cable pair B of port 2
Negative signal of cable pair B of port 2
Positive signal of cable pair A of port 3
Negative signal of cable pair A of port 3
Positive signal of cable pair B of port 3
Negative signal of cable pair B of port 3
Cable Termination voltage source for port 1
Cable Termination voltage source for port 2
Cable Termination voltage source for port 3
Table 3.2
Pin description - test pins
Pin name
CLK98
PLLDIS
SCI[0:2]
SCO[0:2]
TCK
Pin number
35
49
76, 67, 65
68, 66, 64
72
I/O
I
I
I
I
I
Description
98.304 MHz Oscillator input, used when PLLDIS is tied to V
DD
Internal PLL disable pin. Tie to V
DD
to disable internal PLL.
Used to serially shift data into the SBPH400 for production test
Used to serially shift data out of the SBPH400 for production test
Test clock. Used to clock data into and out of the SBPH400 during
operation of the Test Access Port or production test.
Test Data Input. Used to serially shift test data and test instructions
into the SBPH400 during TAP operations.
Test Data Output. Used to serially shift test data and test
instructions out of the SBPH400 during TAP operations.
Reserved for production test
TDI
75
I
TDO
63
O
TEST
ENABLE
TESTMODE
TMS
70
I
30
69
I
I
Reserved for production test
Test Mode Select. This signal controls the state of the TAP
controller within the SBPH400.
Test Reset. Resets the TAP controller.
TRST#
40
I
Table 3.1
Pin description - normal operation (continued)
Pin name
Pin number
I/O
Description
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