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參數(shù)資料
| 型號(hào)： | AT_8032 |
| 廠商： | Atmel Corp. |
| 英文描述： | 8-bit Embedded Microcontroller Core(8位嵌入式基于工業(yè)標(biāo)準(zhǔn)軟件兼容的微控制器) |
| 中文描述： | 8位嵌入式微控制器核心（8位嵌入式基于工業(yè)標(biāo)準(zhǔn)軟件兼容的微控制器） |
| 文件頁(yè)數(shù)： | 29/39頁(yè) |
| 文件大?。?/td> | 532K |
| 代理商： | AT_8032 |
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AT_8032 Core
29
Test
The test sequence starts when the TEST signal goes high
while RESET is inactive. The test vectors are supplied.
The full test sequence is subdivided into two parts: the first
part resembles a BIST test sequence (six test states), and
the second part is similar to a functional operation (the last
test state of the sequence).
During the entire test sequence, the port P1 is configured
as an output in order to obtain an adequate observability of
the internal circuitry. During the test, ports P0, P2 and P3
are used in the same way as during normal operation.
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