42
S29JL064H
S29JL064HA1 May 7, 2004
Pr el i m i n ary
DC Characteristics
CMOS Compatible
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode
current is 200 nA.
5. Not 100% tested.
Paramete
r Symbol
Parameter Description
Test Conditions
Min
Typ
Max
Unit
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
±1.0
A
ILIT
OE# and RESET# Input Load
Current
VCC = VCC max, OE# = VIH;
OE# or RESET# = 12.5 V
35
A
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max, OE# = VIH
±1.0
A
ILR
Reset Leakage Current
VCC = VCC max; RESET# =
12.5 V
35
A
ICC1
VCC Active Read Current
CE# = VIL, OE# = VIH,
Byte Mode
5 MHz
10
16
mA
1 MHz
2
4
CE# = VIL, OE# =
VIH, Word Mode
5 MHz
10
16
1 MHz
2
4
ICC2
VCC Active Write Current (Notes 2, CE# = VIL, OE# = VIH, WE# = VIL
15
30
mA
ICC3
CE#, RESET# = VCC ± 0.3 V
0.2
5
A
ICC4
RESET# = VSS ± 0.3 V
0.2
5
A
ICC5
Automatic Sleep Mode (Notes
2, 4)
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
0.2
5
A
ICC6
VCC Active Read-While-Program
CE# = VIL, OE# = VIH
Byte
21
45
mA
Word
21
45
ICC7
VCC Active Read-While-Erase
CE# = VIL, OE# = VIH
Byte
21
45
mA
Word
21
45
ICC8
VCC Active Program-While-Erase-
Suspended Current (Notes
2,
5)CE# = VIL, OE# = VIH
17
35
mA
VIL
Input Low Voltage
–0.5
0.8
V
VIH
Input High Voltage
0.7 x VCC
VCC + 0.3
V
VHH
Voltage for WP#/ACC Sector
Protect/Unprotect and Program
Acceleration
VCC = 3.0 V ± 10%
8.5
9.5
V
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 3.0 V ± 10%
11.5
12.5
V
VOL
Output Low Voltage
IOL = 2.0 mA, VCC = VCC min
0.45
V
VOH1
Output High Voltage
IOH = –2.0 mA, VCC = VCC min
0.85 VCC
V
VOH2
IOH = –100 A, VCC = VCC min
VCC–0.4
VLKO
2.3
2.5
V