參數(shù)資料
型號: K9F4G08U0M
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 512M x 8 Bits / 1G x 8 Bits NAND Flash Memory
中文描述: 512M x 8位/ 1克× 8位NAND閃存
文件頁數(shù): 11/41頁
文件大?。?/td> 1076K
代理商: K9F4G08U0M
FLASH MEMORY
11
Advance
K9F4G08U0M
K9K8G08U1M
AC Timing Characteristics for Command / Address / Data Input
NOTES :
1. The transition of the corresponding control pins must occur only once while WE is held low
2. tADL is the time from the WE rising edge of final address cycle to the WE rising edge of first data cycle
Parameter
Symbol
Min
Max
Unit
CLE Setup Time
t
CLS
(1)
12
-
ns
CLE Hold Time
t
CLH
5
-
ns
CE Setup Time
t
CS
(1)
20
-
ns
CE Hold Time
t
CH
5
-
ns
WE Pulse Width
t
WP
12
-
ns
ALE Setup Time
t
ALS
(1)
12
-
ns
ALE Hold Time
t
ALH
5
-
ns
Data Setup Time
t
DS
(1)
12
-
ns
Data Hold Time
t
DH
5
-
ns
Write Cycle Time
t
WC
25
-
ns
WE High Hold Time
t
WH
10
-
ns
ALE to Data Loading Time
t
ADL
(2)
70
-
ns
Program / Erase Characteristics
NOTE
: 1. Typical value is measured at Vcc=3.3V, T
A
=25
°
C. Not 100% tested.
2. Typical program time is defined as the time that more than 50% of the whole pages are programmed at Vcc of 3.3V and temperature of 25
°
C
within.
Parameter
Symbol
Min
Typ
Max
Unit
Program Time
t
PROG
(2)
-
200
700
μ
s
Dummy Busy Time for Two-Plane Page Program
t
DBSY
-
0.5
1
μ
s
Number of Partial Program Cycles
in the Same Page
Main Array
Nop
-
-
4
cycles
Spare Array
-
-
4
cycles
Block Erase Time
t
BERS
-
1.5
2
ms
相關(guān)PDF資料
PDF描述
K9K8G08U1M 512M x 8 Bits / 1G x 8 Bits NAND Flash Memory
K9F5608Q0C 512Mb/256Mb 1.8V NAND Flash Errata
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