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參數(shù)資料
| 型號： | K9F4G08U0M |
| 廠商： | SAMSUNG SEMICONDUCTOR CO. LTD. |
| 英文描述： | 512M x 8 Bits / 1G x 8 Bits NAND Flash Memory |
| 中文描述： | 512M x 8位/ 1克× 8位NAND閃存 |
| 文件頁數(shù)： | 10/41頁 |
| 文件大小： | 1076K |
| 代理商： | K9F4G08U0M |
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FLASH MEMORY
10
Advance
K9F4G08U0M
K9K8G08U1M
CAPACITANCE
(
T
A
=25
°
C, V
CC
=3.3V, f=1.0MHz)
NOTE
: Capacitance is periodically sampled and not 100% tested.
Item
Symbol
Test Condition
Min
Max
Unit
Input/Output Capacitance
C
I/O
V
IL
=0V
-
10
pF
Input Capacitance
C
IN
V
IN
=0V
-
10
pF
VALID BLOCK
NOTE
:
1. The device may include invalid blocks when first shipped. Additional invalid blocks may develop while being used. The number of valid blocks is pre-
sented with both cases of invalid blocks considered. Invalid blocks are defined as blocks that contain one or more bad bits. Do not erase or program
factory-marked bad blocks. Refer to the attached technical notes for appropriate management of invalid blocks.
2. The 1st block, which is placed on 00h block address, is guaranteed to be a valid block, does not require Error Correction up to 1K program/erase
cycles.
* : Each K9F4G08U0M chip in the K9K8G08U1M has Maximun 80 invalid block.
Parameter
Symbol
Min
Typ.
Max
Unit
K9F4G08U0M
N
VB
4,016
-
4,096
Blocks
K9K8G08U1M
N
VB
8,032*
-
8,192*
Blocks
AC TEST CONDITION
(K9F4G08U0M-XCB0 :T
A
=0 to 70
°
C, K9F4G08U0M-XIB0:T
A
=-40 to 85
°
C
K9F4G08U0M : Vcc=2.7V~3.6V unless otherwise noted)
Parameter
K9F4G08U0M
Input Pulse Levels
0V to Vcc
Input Rise and Fall Times
5ns
Input and Output Timing Levels
Vcc/2
Output Load
1 TTL GATE and CL=50pF
MODE SELECTION
NOTE
: 1. X can be V
IL
or V
IH.
2. WP should be biased to CMOS high or CMOS low for standby.
CLE
ALE
CE
WE
RE
WP
Mode
H
L
L
H
X
Read Mode
Command Input
L
H
L
H
X
Address Input(5clock)
H
L
L
H
H
Write Mode
Command Input
L
H
L
H
H
Address Input(5clock)
L
L
L
H
H
Data Input
L
L
L
H
X
Data Output
X
X
X
X
H
X
During Read(Busy)
X
X
X
X
X
H
During Program(Busy)
X
X
X
X
X
H
During Erase(Busy)
X
X
(1)
X
X
X
L
Write Protect
X
X
H
X
X
0V/V
CC
(2)
Stand-by
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| K9K8G08U1M | 512M x 8 Bits / 1G x 8 Bits NAND Flash Memory |
| K9F5608Q0C | 512Mb/256Mb 1.8V NAND Flash Errata |
| K9F5608Q0C-D | 512Mb/256Mb 1.8V NAND Flash Errata |
| K9F5608Q0C-H | 512Mb/256Mb 1.8V NAND Flash Errata |
| K9F5608U0C | 512Mb/256Mb 1.8V NAND Flash Errata |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| K9F4G08U0M-PCB0 | 制造商:Samsung Semiconductor 功能描述: |
| K9F4G08U0M-PCB0000 | 制造商:Samsung 功能描述:4GB SLC NORMAL X8 TSOP1 - Trays |
| K9F4G08U0M-PCB0T00 | 制造商:Samsung 功能描述:4GB SLC NORMAL X8 TSOP1 - Trays |
| K9F5608D0C | 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:32M x 8 Bit , 16M x 16 Bit NAND Flash Memory |
| K9F5608D0C-D | 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:32M x 8 Bit , 16M x 16 Bit NAND Flash Memory |
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