參數(shù)資料
型號： PPXY8300A6T1
廠商： FREESCALE SEMICONDUCTOR INC
元件分類： Pressure Sensor
英文描述： DIFFERENTIAL, PEIZORESISTIVE PRESSURE SENSOR, RECTANGULAR, SURFACE MOUNT
封裝： SOIC-20
文件頁數(shù)： 142/162頁
文件大?。?/td> 4316K
代理商： PPXY8300A6T1
MPXY8300 Series
Sensors
80
Freescale Semiconductor
NOTE
The accuracy, power consumption and timing specified for a voltage measurement in the electrical specifications
in Section 17 are only guaranteed if the user obtains a voltage reading using the firmware subroutine call,
REIMS_READ_COMP_VOLTAGE.
10.6
Acceleration Measurements
The acceleration measurement consists of an analog interface (ACI) to a acceleration sensing element as shown in
Figure 10-2. Control bits on the MCU operate the ACI to power up the g-Cell and capture a voltage which is converted by the ADC10.
The signal conditioning of the g-Cell begins with a capacitance to voltage conversion (C-V) followed by a switched capacitor
amplifier. This amplifier has adjustable offset and gain trimming that is set by the trim register. The micro-machined pressure
transducer, C-V converter, sample-and-hold, buffer and trim registers are on the MCU and the g-Cell is a separate silicon device
mounted within the same package as the P-Chip, RFX and MCU.
The MCU contains four registers of control, status and trim bits. The proper sequencing of these bits are handled by the
REIMS_READ_COMP_ACCEL_X/Z firmware subroutine described in Section 14.
In order to trim the acceleration response of each device the MCU will transfer the trim data to the trim registers in the ACI from
parameters stored in a designated area of the FLASH memory during the manufacturing process. These trim registers remain
powered up as long as the ACI is powered up, but can also be updated at any time dependent on the user software by calling
the REIMS_ACITD subroutine in the firmware as described in Section 14. As an aid to determine if the trim data has been
corrupted in the application (due to a severe EMI event) a parity check circuit is always checking the trim register. The normal
case is for the parity of all trim bits (including the added parity bit) is to be an odd number. If the parity ever switches to an even
number of bits then the VACC output from the ACI will be forced to VMIN which is near VSS, which yields a result near $00 from
the ADC10. If this occurs the user software should initiate a trim update and check that the parity problem has been solved.
Figure 10-2 ACI to g-Cell Block Diagram
The g-Cell contains two acceleration sensing elements with one oriented to sense acceleration along the axis through the top of
the package (Z-axis) and along the axis that is parallel to the rows of pins on the package (X-axis). The device needs to be
oriented in the application to obtain the desired acceleration axis.
There is only one acceleration processing signal chain and each axis must be measured as a separate measurement. The ZSEL
bit in the ACIC register selects the Z-axis when it is set and the X-axis when it is clear. The polarity of the Z-axis signal can be
reversed from that shown in Figure 2-2 by a bit in the trim data. User must specify the desired polarity for the final manufacturing
trim/test process. The response of either axis of the g-Cell can be filtered with a simple 2-pole, 500 Hz low pass filter. These
control bits can be controlled by the REIMS_READ_COMP_ACCEL_X/Z firmware routine as passed parameters.
AZ
g-Cell
AY
ACCEL
CHIP
fMFO
MFOEA
MFOEP
MFO
8
μSec
MFOEM MFOEM
INTERFACE
MCU DATA BUS
ADC10
AD0
TRIG
VACC
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