參數(shù)資料
型號: 70T631S12DDGI
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: SRAM
英文描述: 256K X 18 DUAL-PORT SRAM, 12 ns, PQFP144
封裝: 20 X 20 MM, 1.40 MM HIEGHT, GREEN, TQFP-144
文件頁數(shù): 5/27頁
文件大?。?/td> 220K
代理商: 70T631S12DDGI
13
IDT70T633/1S
High-Speed 2.5V 512/256K x 18 Asynchronous Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing(1,5,8)
Timing Waveform of Write Cycle No. 2, CE Controlled Timing(1,5,8)
NOTES:
1. R/
W or CE or UB or LB = VIH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of a
CE = VIL and a R/W = VIL for memory array writing cycle.
3. tWR is measured from the earlier of
CE or R/W (or SEM or R/W) going HIGH to the end of write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the
CE or SEM = VIL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal is asserted last,
CE or R/W.
7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 1).
8. If
OE = VIL during R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be
placed on the bus for the required tDW. If
OE = VIH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the
specified tWP.
9. To access RAM,
CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL
and CE1 = VIH.
CE = VIH when CE0 = VIH and/or CE1 = VIL.
R/
W
tWC
tHZ
tAW
tWR
tAS
tWP
DATAOUT
(2)
tWZ
tDW
tDH
tOW
OE
ADDRESS
DATAIN
(6)
(4)
(7)
UB, LB
5670 drw 10
(9)
CE or SEM
(9)
(7)
(3)
.
(7)
5670 drw 11
tWC
tAS
tWR
tDW
tDH
ADDRESS
DATAIN
R/
W
tAW
tEW
UB, LB
(3)
(2)
(6)
CE or SEM
(9)
.
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