參數(shù)資料
型號: W972GG8JB-25
廠商: WINBOND ELECTRONICS CORP
元件分類: DRAM
英文描述: 256M X 8 DDR DRAM, 0.4 ns, PBGA60
封裝: 11 X 11.50 MM, ROHS COMPLIANT, WBGA-60
文件頁數(shù): 42/86頁
文件大小: 1466K
代理商: W972GG8JB-25
W972GG8JB
Publication Release Date: Feb. 18, 2011
- 47 -
Revision A02
Notes:
1.
All voltages are referenced to VSS.
2.
Tests for AC timing, IDD, and electrical AC and DC characteristics may be conducted at nominal reference/supply voltage
levels, but the related specifications and device operation are guaranteed for the full voltage range specified. ODT is
disabled for all measurements that are not ODT-specific.
3.
AC timing reference load:
DQ
DQS
Output
Timing
reference
point
VTT = VDDQ/2
25
Ω
VDDQ
DUT
Figure 16
AC timing reference load
4.
This is a minimum requirement. Minimum read to precharge timing is AL + BL / 2 provided that the tRTP and tRAS(min)
have been satisfied.
5.
If refresh timing is violated, data corruption may occur and the data must be re-written with valid data before a valid READ
can be executed.
6.
This is an optional feature. For detailed information, please refer to “operating temperature condition” section 9.2 in this data
sheet.
7.
tCKE min of 3 clocks means CKE must be registered on three consecutive positive clock edges. CKE must remain at the
valid input level the entire time it takes to achieve the 3 clocks of registration. Thus, after any CKE transition, CKE may not
transition from its valid level during the time period of tIS + 2 x tCK + tIH.
8.
A minimum of two clocks (2 *nCK) is required irrespective of operating frequency.
9.
tWTR is at least two clocks (2 * nCK) independent of operation frequency.
10. There are two sets of values listed for Command/Address input setup time: tIS(base) and tIS(ref). The tIS(ref) value (for
reference only) is equivalent to the baseline value of tIS(base) at VREF when the slew rate is 1.0 V/nS. The baseline value
tIS(base) is the JEDEC defined value, referenced from the input signal crossing at the VIH(ac) level for a rising signal and
VIL(ac) for a falling signal applied to the device under test. See Figure 17. If the Command/Address slew rate is not equal to
1.0 V/nS, then the baseline values must be derated by adding the values from table of tIS/tIH derating values for DDR2-667,
DDR2-800 and DDR2-1066 (page 55).
CLK
tIS(base)
tIH(base)
tIS(base)
tIH(base)
VDDQ
VIH(ac) min
VIH(dc) min
VREF(dc)
VIL(dc) max
VIL(ac) max
VSS
tIS(ref)
tIH(ref)
tIS(ref)
tIH(ref)
Logic levels
VREF levels
Figure 17
Differential input waveform timing – tIS and tIH
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