參數(shù)資料
型號: MSC8103M1200F
廠商: MOTOROLA INC
元件分類: 數(shù)字信號處理
英文描述: 64-BIT, 75 MHz, OTHER DSP, PBGA332
封裝: 17 X 17 MM, FLIP-CHIP, PLASTIC, BGA-332
文件頁數(shù): 64/120頁
文件大小: 1952K
代理商: MSC8103M1200F
1-44
JTAG Test Access Port Signals
1.8 JTAG Test Access Port Signals
The MSC8103 supports the standard set of Test Access Port (TAP) signals defined by IEEE 1149.1
Standard Test Access Port and Boundary-Scan Architecture specification and described in Table 1-11.
PD7
SMC1: SMSYN
FCC1: TXADDR3
UTOPIA master
FCC1: TXADDR3
UTOPIA slave
FCC1: TXCLAV2
UTOPIA multi-PHY master,
direct polling
Input
Output
Input
SMC1: Serial Management Synchronization
Supported by SMC1. SMSYN is an input. The SMC
interface consists of SMTXD, SMRXD, SMSYN and a clock.
Not all signals are used for all applications. SMCs are
full-duplex ports that supports three protocols or modes:
UART, transparent or general-circuit interface (GCI).
FCC1: UTOPIA Master Transmit Address Bit 3
In the ATM UTOPIA master interface supported by FCC1
using multiplexed polling, this is transmit address bit 3.
FCC1: UTOPIA Slave Transmit Cell Available 2
In the ATM UTOPIA slave interface supported by FCC1
using multiplexed polling, this is transmit address bit 3.
FCC1: UTOPIA Multi-PHY Master Transmit Cell
Available 2 Direct Polling
In the ATM UTOPIA master interface supported by FCC1
using direct polling, TXCLAV2 is asserted by an external
UTOPIA slave PHY to indicate that it can accept one
complete ATM cell.
Table 1-11. JTAG Test Access Port Signals
Signal
Name
Type
Signal Description
TCK
Input
Test Clock—A test clock signal for synchronizing JTAG test logic.
TDI
Input
Test Data Input—A test data serial signal for test instructions and data. TDI is sampled
on the rising edge of TCK and has an internal pull-up resistor.
TDO
Output
Test Data Output—A test data serial signal for test instructions and data. TDO can be
tri-stated. The signal is actively driven in the shift-IR and shift-DR controller states and
changes on the falling edge of TCK.
TMS
Input
Test Mode Select—Sequences the test controller’s state machine, is sampled on the
rising edge of TCK, and has an internal pull-up resistor.
TRST
Input
Test Reset—Asynchronously initializes the test controller, has an internal pull-up
resistor, and must be asserted after power up.
Table 1-10. Port D Signals (Continued)
Name
Dedicated
I/O Data
Direction
Description
General-
Purpose
I/O
Peripheral Controller:
Dedicated I/O
Protocol
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