參數(shù)資料
型號: W971GG6IB-25
廠商: WINBOND ELECTRONICS CORP
元件分類: DRAM
英文描述: 32M X 16 DDR DRAM, 0.4 ns, PBGA84
封裝: 8 X 12.50 MM, ROHS COMPLIANT, WBGA-84
文件頁數(shù): 42/86頁
文件大?。?/td> 1360K
代理商: W971GG6IB-25
W971GG6IB
Publication Release Date: Oct. 23, 2009
- 47 -
Revision A02
Notes:
1. All voltages are referenced to VSS.
2. Tests for AC timing, IDD, and electrical AC and DC characteristics may be conducted at nominal reference/supply voltage
levels, but the related specifications and device operation are guaranteed for the full voltage range specified. ODT is
disabled for all measurements that are not ODT-specific.
3. AC timing reference load:
DQ
DQS
Output
Timing
reference
point
VTT = VDDQ/2
25
VDDQ
DUT
Figure 16 — AC timing reference load
4. This is a minimum requirement. Minimum read to precharge timing is AL + BL / 2 provided that the tRTP and tRAS(min)
have been satisfied.
5. If refresh timing is violated, data corruption may occur and the data must be re-written with valid data before a valid READ
can be executed.
6. This is an optional feature. For detailed information, please refer to “operating temperature condition” section 9.2 in this data
sheet.
7. tCKE min of 3 clocks means CKE must be registered on three consecutive positive clock edges. CKE must remain at the
valid input level the entire time it takes to achieve the 3 clocks of registration. Thus, after any CKE transition, CKE may not
transition from its valid level during the time period of tIS + 2 x tCK + tIH.
8. A minimum of two clocks (2 *nCK) is required irrespective of operating frequency.
9. tWTR is at least two clocks (2 * nCK) independent of operation frequency.
10. There are two sets of values listed for Command/Address input setup time: tIS(base) and tIS(ref). The tIS(ref) value (for
reference only) is equivalent to the baseline value of tIS(base) at VREF when the slew rate is 1.0 V/nS. The baseline value
tIS(base) is the JEDEC defined value, referenced from the input signal crossing at the VIH(ac) level for a rising signal and
VIL(ac) for a falling signal applied to the device under test. See Figure 17. If the Command/Address slew rate is not equal to
1.0 V/nS, then the baseline values must be derated by adding the values from table of tIS/tIH derating values for DDR2-667,
DDR2-800 and DDR2-1066 (page 55).
CLK
tIS(base) tIH(base)
VDDQ
VIH(ac) min
VIH(dc) min
VREF(dc)
VIL(dc) max
VIL(ac) max
VSS
tIS(ref)
tIH(ref)
tIS(ref)
tIH(ref)
Logic levels
VREF levels
Figure 17 — Differential input waveform timing – tIS and tIH
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