參數(shù)資料
型號(hào): MT46V64M8
廠商: Micron Technology, Inc.
英文描述: 16 Meg x 8 x 4 banks DDR SDRAM(16M x 8 x 4組,雙數(shù)據(jù)速率同步動(dòng)態(tài)RAM)
中文描述: 16梅格× 8 × 4銀行DDR SDRAM內(nèi)存(1,600 × 8 × 4組,雙數(shù)據(jù)速率同步動(dòng)態(tài)RAM)的
文件頁數(shù): 52/70頁
文件大?。?/td> 2524K
代理商: MT46V64M8
52
512Mb: x4, x8, x16 DDR SDRAM
512Mx4x8x16DDR_A.p65
Rev. A; Pub 10/00
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2000, Micron Technology, Inc.
512Mb: x4, x8, x16
DDR SDRAM
ADVANCE
NOTES (continued)
32. V
DD
must not vary more than 4% if CKE is not
active while any bank is active.
33. The clock is allowed up to ±150ps of jitter. Each
timing parameter is allowed to vary by the same
amount.
34.
t
HPmin is the lesser of
t
CL minimum and
t
CH
minimum actually applied to the device CK and
CK/ inputs, collectively during bank active.
35. READs and WRITEs with autoprecharge are not
allowed to be issued until
t
RAS(
MIN
) can be
satisfied prior to the internal precharge com-
mand being issued.
36. Applies to x16 only. First DQS (LDQS or UDQS)
to transition to last DQ (DQ0-DQ15) to
transition valid. Initial JEDEC specifications
suggested this to be same as
t
DQSQ.
37.Normal Output Drive Curves:
a) The full variation in driver pull-down current from
minimum to maximum process, temperature and
voltage will lie within the outer bounding lines of
the V-I curve of Figure A.
b) The variation in driver pull-down current
within nominal limits of voltage and tempera-
ture is expected, but not guaranteed, to lie
within the inner bounding lines of the V-I
curve of Figure A.
c) The full variation in driver pull-up current
from minimum to maximum process,
temperature and voltage will lie within the
outer bounding lines of the V-I curve of Figure
B.
d) The variation in driver pull-up current within
nominal limits of voltage and temperature is
expected, but not guaranteed, to lie within
the inner bounding lines of the V-I curve of
Figure B.
e) The full variation in the ratio of the maximum
to minimum pull-up and pull-down current
should be between .71 and 1.4, for device
drain-to-source voltages from 0.1V to 1.0
Volt, and at the same voltage and tempera-
ture.
f) The full variation in the ratio of the nominal
pull-up to pull-down current should be unity
±10%, for device drain-to-source voltages
from 0.1V to 1.0 volt.
Figure A
Pull-Down Characteristics
0
20
40
60
80
100
120
140
160
0.0
0.5
1.0
1.5
2.0
2.5
V
OUT
(V)
I
O
Figure B
Pull-Up Characteristics
-200
-180
-160
-140
-120
-100
-80
-60
-40
-20
0
0.0
0.5
1.0
1.5
2.0
2.5
V
DD
Q - V
OUT
(V)
I
O
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