參數(shù)資料
型號: CY7C1381D-133BZXC
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 18-Mbit (512K x 36/1M x 18) Flow-Through SRAM
中文描述: 512K X 36 CACHE SRAM, 6.5 ns, PBGA165
封裝: 13 X 15 MM, 1.40 MM HEIGHT, LEAD FREE, MO-216, FBGA-165
文件頁數(shù): 20/29頁
文件大小: 477K
代理商: CY7C1381D-133BZXC
PRELIMINARY
CY7C1381D
CY7C1383D
Document #: 38-05544 Rev. *A
Page 20 of 29
Thermal Resistance
[18]
Parameter
Θ
JA
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
Test conditions follow standard
test methods and procedures
for measuring thermal
impedence, per EIA / JESD51.
TQFP Package BGA Package fBGA Package
31
45
Unit
°C/W
46
Θ
JC
6
7
3
°C/W
Capacitance
[18]
Parameter
C
IN
C
CLK
C
I/O
Description
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
DD
= 3.3V.
V
DDQ
= 2.5V
TQFP Package
5
5
5
BGA Package
8
8
8
fBGA Package
9
9
9
Unit
pF
pF
pF
Input Capacitance
Clock Input Capacitance
Input/Output Capacitance
AC Test Loads and Waveforms
Switching Characteristics
Over the Operating Range
[20, 21]
Parameter
t
POWER
Clock
t
CYC
t
CH
t
CL
Output Times
t
CDV
t
DOH
t
CLZ
t
CHZ
t
OEV
t
OELZ
t
OEHZ
Setup Times
t
AS
Description
133 MHz
Min.
1
100 MHz
Min.
1
Unit
ms
Max.
Max.
V
DD
(Typical) to the first Access
[19]
Clock Cycle Time
Clock HIGH
Clock LOW
7.5
2.1
2.1
10
2.5
2.5
ns
ns
ns
Data Output Valid After CLK Rise
Data Output Hold After CLK Rise
Clock to Low-Z
[20, 21, 22]
Clock to High-Z
[20, 21, 22]
OE LOW to Output Valid
OE LOW to Output Low-Z
[20, 21, 22]
OE HIGH to Output High-Z
[20, 21, 22]
6.5
8.5
ns
ns
ns
ns
ns
ns
ns
2.0
2.0
0
2.0
2.0
0
4.0
3.2
5.0
3.8
0
0
4.0
5.0
Address Set-up Before CLK Rise
1.5
1.5
ns
OUTPUT
R = 317
R = 351
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Z
0
= 50
V
T
= 1.5V
3.3V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
1ns
1ns
(c)
OUTPUT
R = 1667
R =1538
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Z
0
= 50
V
T
= 1.25V
2.5V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
1ns
1ns
(c)
3.3V I/O Test Load
2.5V I/O Test Load
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