參數(shù)資料
型號: AMIS-53050
英文描述: Frequency Agile Transceiver
中文描述: 捷變頻收發(fā)器
文件頁數(shù): 103/107頁
文件大?。?/td> 2576K
代理商: AMIS-53050
AMIS-53050
Frequency Agile Transceiver
Data Sheet
9.2.12. Digital Test MUX C
This register allows test signals to be routed to the indicated pins of the AMIS-53050. These signals can help in the development of an
application using the AMIS-53050. The test unlock register code must be written, then this test register is written and then the test
n
changed or there is a reset of the AMIS-53050, even if the test unlock register code value is
d.
Table 118: Digital Test MUX C - 0X4D [77]
Bit
Test Pin
Comment
1111
ed
Undefin
1110
Undefined
1101
goo
EE BIST
d
1100
Clock
AM Filter
1011
A
CPEN
1010
ROM
done
BIST
1001
T b
ROM BIS
ad
1000
BIST done
RAM
1111
Undefined
1110
Undefined
1101
Undefined
1100
Undefined
1011
Undefined
1010
Undefined
1001
Undefined
1000
Undefined
functio
change
will be enabled until either is
0
0110
0
101
0100
BIST
d
111
RAM
EE BIST done
IST
EE B
Busy
ba
bad
0
0010
0
001
0
000
0111
0110
0101
0100
0011
0010
uctio
able
011
Instr
Bandgap
L
XTA
DSSN
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
n en
power down
7:4
MUX to
Data SSN
1111 - 00
00
0001
0000
Undefined
Undefined
3:0
Reserved
1111- 0000
9.2.13. Digital Test Mode A
ster is used for factory testing of the AMIS-53050 and has no user functions.
This regi
.2.14. Digital Test Mode B
9
his register is used for factory testing of the AMIS-53050 and has no user functions.
.2.15. Digital Test Mode C
9
his register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.16. Digital Test Mode D
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.17. Memory Test Mode Address
This register is used for factory testing of the AMIS-53050 and has no user functions.
9
T
T
T
.2.18. Memory Test Mode Data
his register is used for factory testing of the AMIS-53050 and has no user functions.
103
AMI Semiconductor
– Jan. 07, M-20639-002
www.amis.com
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