參數(shù)資料
型號: AMIS-53050
英文描述: Frequency Agile Transceiver
中文描述: 捷變頻收發(fā)器
文件頁數(shù): 100/107頁
文件大?。?/td> 2576K
代理商: AMIS-53050
AMIS-53050
Frequency Agile Transceiver
Data Sheet
9.0 Built-in Test Functions
The AMIS-53050 has a number of test registers. These registers are not available to the general user of the AMIS-53050. However,
many of these registers control test features are useful in the development of applications using the AMIS-53050.
Register descriptions
:
Test Unlock
- A special code is required to unlock the functions of the test registers.
Test
- Registers that route signals to pins for monitoring or turn internal circuits
9.1
Un
Re
ter
T
determine
A
be reset with a rese
R
er d
T
** Registe
veloper desi
he de
the a
MIS
less produc
ing t
of
t su
f th
t o
0 ma
r. These registers are locked from use by a
tain the c
will lo
e part and thus
ck the user out of the tes
est modes to monitor the
code word. To
rati
nlock the test registers contact
test registers. This register will
he
he AMIS-53050 or to
on of t
ctiv
wire
ock register to access t
t registers.
tions:
nlo
- Re
cod
-53050 is ope
ith
be
Table 114:
Bit
nlo
od
off for test.
TM
lock
gis
gn
ity
he AMIS-5305
some paramete
pport to ob
y desire to use some of the t
ope
ode. Enter this code in the unl
egist
escrip
est U
ck
gister contains a
e about the state the AMIS
rating in.
rs w
the ** mark can
trimmed if the test registers are unlocke .
Test U
Name
ck C
e - 0X40 [64]
Comment
Code to unlock operation of the test registers (contact AMIS for the code to unlock th
functions)
7:0
U
[7
st re
NLOCK
:0]
e te
gister
9.2 Test R
ers
T
measuring
llow
all
nal
be
e A
monitoring. They also
the AMIS-53050 on and off for
9.2.1. IF A
an
rim
T
gis
se
r fa
f the A
9.2.2. IF A
an
rim
T
gis
se
r fa
g of the A
ions.
9
LL
al
T
gis
se
r fa
the A
ctions.
9.2.4. PLL Test Mo
his register is used for factory testing of the AMIS-53050 and has no user functions.
egist
he fo
ing registers
the operatio
ow for signals to
parameters of th
routed to pins for
MIS-53050.
turn functions in
mp M
ual T
A
his re
ter is u
d fo
ctory testing o
MIS-53050 and has no user functions.
mp M
ual T
B
his re
ter is u
d fo
ctory testin
MIS-53050 and has no user funct
.2.3. P
Manu
Trim
his re
ter is u
d fo
ctory testing of
MIS-53050 and has no user fun
des
T
100
AMI Semiconductor
– Jan. 07, M-20639-002
www.amis.com
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