參數(shù)資料
型號: AMIS-53050
英文描述: Frequency Agile Transceiver
中文描述: 捷變頻收發(fā)器
文件頁數(shù): 101/107頁
文件大?。?/td> 2576K
代理商: AMIS-53050
AMIS-53050
Frequency Agile Transceiver
Data Sheet
9.2.5. Power Down RF Sections
This regis
used for fa
the A
nd has no user functions.
9.2.6. Anal
st Mode
Dig
SYSclock and xInt
ad
t:
exc
2mA
errupt are 1mA I/O with pull up
chmitt triggers. The
s and S
Au
to
rem
t D
ste
abl
e I
2
C
dre
s. I
low repeated writes
djustin
Table 115: Anal
Bit
Name
ter is
ctory testing of
MIS-53050 a
og Te
ital P
Tes
All digital pads
errupt pads
are
ept system clock out, and xInt
outputs.
to Inc
the sam regi
en
isable:
This dis
r, useful for a
es the automatic incrementing of th
g a parameter to optimize its va
lue.
register ad
sse
t can al
og Test Mode - 0X47 [71]
State
1
0
1
0
1
0
1
0
1
0
1
0
Comment
Enable th
Enable the ADC1 input channel as a direct input to the data filter
Normal op ration
e
Override t
he brown-out POR to allow test at any
Address increment disabled (IIC only)
Dither is a
pplied to the sigma-delta circuits in th
Ignore crystal control (digital clock gating)
apacitance t
value
e test mode for determination of c
rim
7
CA
P_TRIM
6
Pip
filter
1 to
e ADC
data
voltage
5
Bro
dow
po
wn-out
n
wer
4
Aut
Disable
me
o incre
nt
e PLL
3
Dith
e
er mod
2
Ignore XTAL control
1
bled:
Ena
1
Dig
st A
abled
pad te
0
Dis
Enabled:
Disabled
1
0
Dig
st B
pad te
0
9.2.7. RF
od
T is regis
se
r fa
e A
ns.
9.2.8. Anal
st MUX
T is regis
se
r fa
f the AMIS-53050 and has no user functions.
ctory testing o
.9. RF
UX
This register is used for factory testing of the AMIS-53050 and has no user functions.
Test M
es
h
ter is u
d fo
ctory testing of th
MIS-53050 and has no user functio
og Te
h
ter is u
d fo
9.2
Test M
101
AMI Semiconductor
– Jan. 07, M-20639-002
www.amis.com
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