參數(shù)資料
型號: TLC34076-170
廠商: Texas Instruments, Inc.
英文描述: Color-Palette(170MHz,與TLC34075兼容,另具24位和16位真彩色模式)
中文描述: 顏色調(diào)色板(170MHz的,與TLC34075兼容,另具24位和16位真彩色模式)
文件頁數(shù): 38/60頁
文件大小: 408K
代理商: TLC34076-170
2–21
2.11.5
This bit specifies either little- or big-endian data format for the pixel bus frame buffer interface (see
Section 2.6).
Little-/Big-Endian-Mode Control (Bit 6)
0: Little-endian (default)
1: Big-endian
2.11.6
The MUXOUT bit indicates to external circuitry that the device is running in the VGA pass-through mode.
This bit does not affect the operation of the device (see Section 2.10).
MUXOUT (Bit 7)
0: MUXOUT is low (default in VGA pass-through mode)
1: MUXOUT is high
2.12 Test Register
Three test functions are provided in the TLC34076-170 and are controlled and monitored through the test
register. The tests are data flow check, DAC analog test, and screen integrity test.
The test register has two ports: one for a control word, accessed by writing to the register location, and one
for the data word, accessed by reading from the register location. Depending on the channel written in the
control word, the data read presents the information for that channel.
The control word is three bits long and occupies D<2:0>. It specifies which of the eight channels to inspect.
The following table and state machine diagrams show how each channel is addressed:
Table 2–11. Test Mode Selection
D1
D0
0
0
Color palette red value
0
1
Color palette green value
1
0
Color palette blue value
1
1
Identification code
0
0
Ones accumulation red value
0
1
Ones accumulation green value
1
0
Ones accumulation blue value
1
1
Analog test
D2
0
0
0
0
1
1
1
1
CHANNEL
011
010
001
000
110
101
100
111
ID code
RD
RD
RD
RD
RESET
Blue
Green
Red
RD
RD
RD
Red
Blue
Green
RD
DATA FLOW CHECK
DAC ANALOG TEST
SCREEN INTEGRITY TEST
Figure 2–11. Test Register Control Word State Diagrams
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