
NSE-8G Standard Product Data Sheet
Preliminary
Proprietary and Confidential to PMC-Sierra, Inc., and for its Customers’ Internal Use
Document ID: PMC-2010850, Issue 1
163
The general multicast problem is not considered in this document. See the PMC NSE-8G
documentation for descriptions of the use of multicast in a protection switching schemes; the
same concepts apply to NSE/SBS fabrics.
12.14 JTAG Support
The NSE-8G supports the IEEE Boundary Scan Specification as described in the IEEE 1149.1
standards. The Test Access Port (TAP) consists of the five standard pins, TRSTB, TCK, TMS,
TDI and TDO used to control the TAP controller and the boundary scan registers. The TRSTB
input is the active-low reset signal used to reset the TAP controller. TCK is the test clock used to
sample data on input, TDI and to output data on output, TDO. The TMS input is used to direct the
TAP controller through its states. The basic boundary scan architecture is shown below.
Figure 34 Boundary Scan Architecture
Boundary Scan
Register
Control
TDI
TDO
Device Identification
Register
Bypass
Register
Instruction
Register
and
Decode
TRSTB
TMS
TCK
Test
Access
Port
Controller
Mux
DFF
Select
Tri-state Enable
The boundary scan architecture consists of a TAP controller, an instruction-register with
instruction-decode, a bypass register, a device identification register and a boundary scan register.
The TAP controller interprets the TMS input and generates control signals to load the instruction
and data registers. The instruction register with instruction decode block is used to select the test
to be executed and/or the register to be accessed. The bypass register offers a single-bit delay
from primary input, TDI to primary output, TDO. The device identification register contains the
device identification code.
The boundary scan register allows testing of board inter-connectivity. The boundary scan register
consists of a shift register place in series with device inputs and outputs. Using the boundary scan
register, all digital inputs can be sampled and shifted out on primary output, TDO. In addition,
patterns can be shifted in on primary input, TDI and forced onto all digital outputs.