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| 型號： | MFRC52301HN1 |
| 廠商： | NXP Semiconductors N.V. |
| 元件分類： | 通信及網絡 |
| 英文描述： | Contactless reader IC |
| 封裝： | MFRC52301HN1<SOT617-1 (HVQFN32)|<<http://www.nxp.com/packages/SOT617-1.html<1<Always Pb-free,;MFRC52301HN1<SOT617-1 (HVQFN32)|<<http://www.nxp.com/packages/SOT617-1.html& |
| 文件頁數(shù)： | 64/98頁 |
| 文件大?。?/td> | 1666K |
| 代理商： | MFRC52301HN1 |
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MFRC523
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.7 — 8 November 2011
115237
64 of 98
NXP Semiconductors
MFRC523
Contactless reader IC
Table 131. AutoTestReg register bit descriptions
Bit
Symbol
7
reserved
6
AmpRcv
9.2.4.8
VersionReg register
Shows the MFRC523 software version.
Table 132. VersionReg register (address 37h); reset value: xxh bit allocation
Bit
7
6
5
Symbol
Access
Table 133. VersionReg register bit descriptions
Bit
Symbol
7 to 0
Version[7:0]
9.2.4.9
AnalogTestReg register
Determines the analog output test signal at, and status of, pins AUX1 and AUX2.
Table 134. AnalogTestReg register (address 38h); reset value: 00h bit allocation
Bit
7
6
5
Symbol
AnalogSelAux1[3:0]
Access
R/W
Value
-
1
Description
reserved for production tests
internal signal processing in the receiver chain is performed
non-linearly which increases the operating distance in
communication modes at 106 kBd
Remark:
due to non-linearity, the effect of the RxThresholdReg
register’s MinLevel[3:0] and the CollLevel[2:0] values is also
non-linear
reserved for production tests
If set to logic 0 and the EOFSOFwidth bit is set to logic 1 it
results in the maximum length of SOF and EOF according to
ISO/IEC 14443 B
If set to logic 0 and the EOFSOFwidth bit is set to logic 0 it
results in the minimum length of SOF and EOF according to
ISO/IEC 14443 B
If this bit is set to logic 1 and the EOFSOFwidth bit is logic 1, it
results in
SOF high = (2 ETU + 8 cycles) / f
clk
SOF low = (11 ETU
8 cycles) / f
clk
EOF low = (11 ETU
8 cycles) / f
clk
enables the digital self-test. The self-test can also be started by
the CalcCRC command; see
Section 10.3.1.4 “CalcCRC
command” on page 69
. Self-test is enabled by 1001b.
Remark:
for default operation the self-test must be disabled
by 0000b
5
4
reserved
EOFSOFAdjust
-
0
1
3 to 0
SelfTest[3:0]
-
4
Version[7:0]
R
3
2
1
0
Description
indicates current MFRC523 software version
Remark:
the current version of the MFRC523 is B1h or B2h
4
3
2
1
0
AnalogSelAux2[3:0]
R/W
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| MFRC52301HN1,151 | 功能描述:RFID應答器 IC TRANSMISSION MOD 32-HVQFN RoHS:否 制造商:Murata 存儲容量:512 bit 工作溫度范圍:- 40 C to + 85 C 安裝風格:SMD/SMT 封裝 / 箱體: 封裝:Reel |
| MFRC52301HN1,157 | 功能描述:RFID應答器 IC TRANSMISSION MOD 32-HVQFN RoHS:否 制造商:Murata 存儲容量:512 bit 工作溫度范圍:- 40 C to + 85 C 安裝風格:SMD/SMT 封裝 / 箱體: 封裝:Reel |
| MFRC52301HN1/TRAYB | 制造商:PHILIPS 制造商全稱:NXP Semiconductors 功能描述:Contactless reader IC |
| MFRC52301HN1/TRAYBM | 制造商:PHILIPS 制造商全稱:NXP Semiconductors 功能描述:Contactless reader IC |
| MFRC52302HN1,151 | 功能描述:RFID應答器 CONTACTLESS READER IC RoHS:否 制造商:Murata 存儲容量:512 bit 工作溫度范圍:- 40 C to + 85 C 安裝風格:SMD/SMT 封裝 / 箱體: 封裝:Reel |
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