參數(shù)資料
型號(hào): IDT82V3280DQG8
廠商: IDT, Integrated Device Technology Inc
文件頁(yè)數(shù): 79/171頁(yè)
文件大小: 0K
描述: IC PLL WAN SE STRATUM 2 100-TQFP
標(biāo)準(zhǔn)包裝: 750
類型: 時(shí)鐘/頻率發(fā)生器,多路復(fù)用器
PLL:
主要目的: 以太網(wǎng),SONET/SDH,Stratum
輸入: CMOS,LVDS,PECL
輸出: CMOS,LVDS,PECL
電路數(shù): 1
比率 - 輸入:輸出: 14:9
差分 - 輸入:輸出: 是/是
頻率 - 最大: 622.08MHz
電源電壓: 3 V ~ 3.6 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 100-LQFP 裸露焊盤
供應(yīng)商設(shè)備封裝: 100-TQFP-EP(14x14)
包裝: 帶卷 (TR)
其它名稱: 82V3280DQG8
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IDT82V3280
WAN PLL
Pin Description
17
December 9, 2008
RDY
75
O
CMOS
RDY: Ready/Data Acknowledge
In Multiplexed and Intel modes, a high level on this pin indicates that a read/write cycle is
completed. A low level on this pin indicates that wait state must be inserted.
In Motorola mode, a low level on this pin indicates that valid information on the data bus is
ready for a read operation or acknowledges the acceptance of the written data during a write
operation.
In EPROM and Serial modes, this pin should be connected to ground.
JTAG (per IEEE 1149.1)
TRST
2
I
pull-down
CMOS
TRST: JTAG Test Reset (Active Low)
A low signal on this pin resets the JTAG test port.
This pin should be connected to ground when JTAG is not used.
TMS
7
I
pull-up
CMOS
TMS: JTAG Test Mode Select
The signal on this pin controls the JTAG test performance and is sampled on the rising edge
of TCK.
TCK
9
I
pull-down
CMOS
TCK: JTAG Test Clock
The clock for the JTAG test is input on this pin. TDI and TMS are sampled on the rising edge
of TCK and TDO is updated on the falling edge of TCK.
If TCK is idle at a low level, all stored-state devices contained in the test logic will indefinitely
retain their state.
TDI
23
I
pull-up
CMOS
TDI: JTAG Test Data Input
The test data is input on this pin. It is clocked into the device on the rising edge of TCK.
TDO
21
O
CMOS
TDO: JTAG Test Data Output
The test data is output on this pin. It is clocked out of the device on the falling edge of TCK.
TDO pin outputs a high impedance signal except during the process of data scanning.
This pin can indicate the interrupt of T0 selected input clock fail, as determined by the
LOS_FLAG_ON_TDO bit (b6, 0BH). Refer to Chapter 3.8.1 Input Clock Validity for details.
Power & Ground
VDDD1
VDDD2
VDDD3
VDDD4
VDDD5
VDDD6
VDDD7
12
16
13
50
61
85
86
Power
-
VDDDn: 3.3 V Digital Power Supply
Each VDDDn should be paralleled with ground through a 0.1 F capacitor.
VDDA1
VDDA2
VDDA3
6
19
91
Power
-
VDDAn: 3.3 V Analog Power Supply
Each VDDAn should be paralleled with ground through a 0.1 F capacitor.
VDD_AMI
26
Power
-
VDD_AMI: 3.3 V Power Supply for AMI I/O
VDD_DIFF1
33
Power
-
VDD_DIFF1: 3.3 V Power Supply for OUT6
VDD_DIFF2
39
Power
-
VDD_DIFF2: 3.3 V Power Supply for OUT7
Table 1: Pin Description (Continued)
Name
Pin No.
I/O
Type
Description 1
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IDT82V3280EQG8 制造商:Integrated Device Technology Inc 功能描述:IC PLL WAN SE STRATUM 2 100TQFP
IDT82V3280EQGBLANK 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:WAN PLL
IDT82V3280PF 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:WAN PLL
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