參數(shù)資料
型號: 33742S
廠商: Motorola, Inc.
元件分類: CAN
英文描述: System Basis Chip (SBC) with Enhanced High-Speed CAN Transceiver
中文描述: 系統(tǒng)基礎(chǔ)芯片的增強(qiáng)型(SBC)的高速CAN收發(fā)器
文件頁數(shù): 4/52頁
文件大?。?/td> 1087K
代理商: 33742S
33742
4
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
MAXIMUM RATINGS
All voltages are with respect to ground unless otherwise noted.
Rating
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage at V
SUP
Terminal
Continuous (Steady-State)
Transient Voltage (Load Dump)
V
SUP
-0.3 to 27
-0.3 to 40
V
Logic Inputs (RXD, TXD, MOSI, MISO,
CS
, SCLK,
RST
,
WDOG
, and
INT
Terminals)
V
LOG
-0.3 to V
DD
+0.3
V
Output Current at V
DD
Terminal
I
DD
Internally Limited
A
HS Terminal
Voltage
Output Current
V
HS
I
HS
-0.3 to V
SUP
+0.3
Internally Limited
V
A
ESD Voltage, Human Body Model
(Note 1)
HS, L0, L1, L2, L3, CANH, CANL Terminals
All Other Terminals
V
ESD1
±4000
±2000
V
ESD Voltage, Machine Model
(Note 2)
V
ESD2
±200
V
L0, L1, L2, L3 Terminals
DC Input Voltage
DC Input Current
Transient Input Voltage with External Component
(Note 3)
V
DCIN
I
DCIN
V
TRINEC
-0.3 to 40
±2.0
±100
V
mA
V
Power Dissipation
(Note 4)
P
D
1.0
W
CANL and CANH Terminals
Continuous Voltage
Continuous Current
V
CANH/L
I
CANH/L
-27 to 40
200
V
mA
CANH and CANL Transient Voltage (Load Dump)
(Note 5)
V
LDH/L
40
V
CANH and CANL Transient Voltage
(Note 6)
V
TRH/L
±40
V
Notes
1.
2.
3.
4.
ESD1 testing is performed in accordance with the Human Body Model (C
ZAP
=100 pF, R
ZAP
=1500
).
ESD2 testing is performed in accordance with the Machine Model (C
ZAP
=200 pF, R
ZAP
=0
).
Testing in accordance with ISO 7637-1. See also
Figure 2
.
Maximum power dissipation at 85°C ambient temperature in free air with no heatsink, according to JEDEC JESD51-2 and JESD51-3
specifications.
Load dump test in accordance with ISO 7637-1.
Transient test in accordance with ISO 7637-1. See also
Figure 3
.
5.
6.
Figure 2. ISO 7637 Test Setup
for L0:L3 Inputs
Figure 3. ISO 7637 Test Setup for CANH/CANL
L
x
Transient Pulse
Generator
(Note)
GND
1.0 nF
10 k
Note
Waveform per ISO 7637-1. Test Pulses 1, 2, 3a, and 3b.
GND
33742
CANH
CANL
Transient Pulse
Generator
(Note)
GND
GND
1.0 nF
1.0 nF
Note
Waveform per
ISO 7637-1. Test Pulses 1, 2, 3a, and 3b.
33742
F
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
n
.
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