參數(shù)資料
型號(hào): W78E354P
廠商: WINBOND ELECTRONICS CORP
元件分類(lèi): 微控制器/微處理器
英文描述: MONITOR MICROCONTROLLER
中文描述: 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PQCC68
封裝: PLASTIC, LCC-68
文件頁(yè)數(shù): 4/45頁(yè)
文件大小: 430K
代理商: W78E354P
W78E354
- 4 -
Pin Description, continued
PIN NO.
68P 64P 48P 40P
PIN
NAME
I/O
TYPE
TEST
NAME
FUNCTIONAL DESCRIPTION
29
30
27
28
21
-
19
-
BSDAC0
BSDAC1
I/O
O/P
A8
-
12-bit PWM/BRM static DAC output.
Sink/Source current 8 mA/-8 mA.
With
slew rate control
and
output delay
:
1. Delay about 5ns: BSDAC1
2. Without delay: BSDAC0.
---------------------------------------------------------
* In the Flash/RAM-test mode
(when the chip is in reset state):
BSDAC0: A8 input.
* In the functional test mode
(CPU executes out of ext. program memory):
BSDAC0: A8 output.
56
57
58
53
54
55
38
39
40
33
-
-
DDAC0
DDAC1
DDAC2
I/O
O/P
A9
-
-
8-bit PWM dynamic DAC output.
Sink/Source current 8 mA/-8 mA.
With
slew rate control
and
output delay
:
1. Delay about 5 nS: DDAC1.
2. Delay about 10 nS: DDAC2.
3. Without delay: DDAC0.
---------------------------------------------------------
* In the Flash/RAM-test mode
(when the chip is in reset state):
DDAC0: A9 input.
* In the functional test mode
(CPU executes out of ext. program memory):
DDAC0: A9 output.
59
56
41
34
BDDAC
I/O
A10
12-bit PWM/BRM dynamic DAC output.
Sink/Source current 8mA/-8mA.
With
slew rate control
.
---------------------------------------------------------
* In the Flash/RAM-test mode
(when the chip is in reset state):
BDDAC: A10 input.
* In the functional test mode
(CPU executes out of ext. program memory):
BDDAC: A10 output.
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