APPENDIX—UL1950 3RD E<" />
參數(shù)資料
型號(hào): SI3062-F-FS
廠商: Silicon Laboratories Inc
文件頁(yè)數(shù): 52/62頁(yè)
文件大?。?/td> 0K
描述: IC DAA ENH FCC LINE-SIDE 16SOIC
標(biāo)準(zhǔn)包裝: 48
功能: 直接存取裝置(DAA)
電路數(shù): 1
電流 - 電源: 9mA
工作溫度: 0°C ~ 70°C
安裝類型: 表面貼裝
封裝/外殼: 16-SOIC(0.154",3.90mm 寬)
供應(yīng)商設(shè)備封裝: 16-SOIC N
包裝: 管件
包括: 結(jié)帳音調(diào)檢測(cè),線路電壓監(jiān)視器,回路電流監(jiān)視器,過(guò)載檢測(cè),振鈴檢測(cè)器
56
Rev. 0.9
Si306x
APPENDIX—UL1950 3RD EDITION
Although designs using the Si306x comply with UL1950
3rd Edition and pass all overcurrent and overvoltage
tests, there are still several issues to consider.
Figure 11 shows two designs that can pass the UL1950
overvoltage tests, and electromagnetic emissions. The
top schematic of Figure 11 shows the configuration in
which the ferrite beads (FB1, FB2) are on the
unprotected side of the sidactor (RV1). For this
configuration, the current rating of the ferrite beads
needs to be 6 A. However, the higher current ferrite
beads are less effective in reducing electromagnetic
emissions.
The bottom schematic of Figure 11 shows the
configuration in which the ferrite beads (FB1, FB2) are
on the protected side of the sidactor (RV1). For this
design, the ferrite beads can be rated at 200 mA.
In a cost optimized design, compliance to UL1950 does
not always require overvoltage tests. Plan ahead to
know which overvoltage tests apply to the system.
System-level elements in the construction, such as fire
enclosure and spacing requirements, need to be
considered during the design stages. Consult with a
professional testing agency during the design of the
product to determine the tests that apply to the system.
Figure 11. Circuits that Pass All UL1950 Overvoltage Tests
RV1
C8
FB1
FB2
TIP
RING
TIP
RING
FB1
FB2
75
@ 100 MHz, 6 A
75
@ 100 MHz, 6 A
600
at 100 MHz, 200 mA
600
at 100 MHz, 200 mA
C9
1.25 A
C8
C9
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