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參數(shù)資料
| 型號： | SCAN926260TUF |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
| 中文描述： | HEX LINE RECEIVER, PBGA196 |
| 封裝： | LBGA-196 |
| 文件頁數(shù)： | 17/18頁 |
| 文件大?。?/td> | 372K |
| 代理商： | SCAN926260TUF |
Pin Descriptions
(Continued)
Pin Name
Type
Pins
Description
ROUTn[0:9]
3.3V CMOS
Output
E2, E4, E12, E13, E14,
F4, G3, G4, G11, G12,
H2, H3, H4, H11, H12, J2,
J3, J11, J12, K2, K3, K4,
K12, K13, L1, L3, L6, L8,
L9, L11, L12, L13, L14,
M1, M2, M3, M4, M5, M6,
M7, M8, M9, M10, M11,
M12, M14, N1, N2, N4,
N6, N9, N11, N12, N13,
N14, P2, P3, P4, P11,
P14
Outputs for the ten bit deserializers; n = deserializer number.
When a channel is not locked, ROUT[0:9] are high for that
channel.
RCLK[0:5]
3.3V CMOS
Output
F2, F13, L2, M13,N5, N10
Recovered clock for each deserializer’s output data. When a
channel is not locked, the RCLK for that channel is high.
Test Mode Select input to support IEEE 1149.1. There is a
weak internal pull-up on TMS that defaults TRST, TDI, TCK
and TDO to be inactive. However, in noisy environments,
pulling TMS high ensures the JTAG test access port (TAP) is
never activated.
Test Reset Input to support IEEE 1149.1. There is a weak
internal pull-up on this pin.
Test Data Input to support IEEE 1149.1. There is a weak
internal pull-up on this pin.
TMS
3.3V CMOS
Input
C1
TRST
3.3V CMOS
Input
3.3V CMOS
Input
3.3V CMOS
Input
3.3V CMOS
Output
3.3V CMOS
Input
C2
TDI
D1
TCK
D2
Test Clock to support IEEE 1149.1
TDO
D3
Test Data Output to support IEEE 1149.1.
BISTMODE_REQ
B10
BIST Alone Error Reporting Mode Select Input.
BIST_SEL[0:2]
3.3V CMOS
Input
C14, D8, D14
These pins control which channels are active for the BIST
Alone operating mode. The BIST Alone Mode Selection Table
describes their function. There are internal pull-ups that default
all BIST_SEL[0:2] to high, which is the idle state for all
channels in the BIST Alone mode.
A high on this pin activates the BIST Alone operating mode.
There is a weak internal pull-down that should default the
BIST_ACT to de-activate the BIST Alone operating mode. In a
noisy operating environment, it is recommended that an
external pull down be used to ensure that BIST_ACT stays in
the low state.
Unused solder ball location. Do not connect.
BIST_ACT
3.3V CMOS
Input
K11
N/C
B13, C13
S
www.national.com
17
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SCAN926260TUFX | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
| SCAN928028 | 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
| SCAN928028TUF | 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
| SCAN928028TUFX | 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
| SCAN92LV090 | 9 Channel Bus LVDS Transceiver with 1149.1 Access |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SCAN926260TUF/NOPB | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機(jī)數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN926260TUFX | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機(jī)數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN926260TUFX/NOPB | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機(jī)數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN928028 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
| SCAN928028TUF | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機(jī)數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
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