參數(shù)資料
型號： NAND04GA3C2AN1E
廠商： 意法半導(dǎo)體
英文描述： 4Gbit, 2112 Byte Page, 3V, Multi-level NAND Flash Memory
中文描述： 4Gbit的，2112字節(jié)的頁，3V供電，多級NAND閃存
文件頁數(shù)： 29/51頁
文件大?。?/td> 374K
代理商： NAND04GA3C2AN1E
NAND04GA3C2A, NAND04GW3C2A
9 Software algorithms
29/51
9
Software algorithms
This section gives information on the software algorithms that ST recommends to implement
to manage the Bad Blocks and extend the lifetime of the NAND device.
NAND Flash memories are programmed and erased by Fowler-Nordheim tunneling using a
high voltage. Exposing the device to a high voltage for extended periods can cause the
oxide layer to be damaged. For this reason, the number of program and erase cycles is
limited (see
Table 14
for value) and it is recommended to implement Garbage Collection,
Wear-Leveling and Error Correction Code algorithms to extend the number of program and
erase cycles and increase the data retention.
To help integrate a NAND memory into an application ST Microelectronics can provide a File
System OS Native reference software, which supports the basic commands of file
management.
Contact the nearest ST Microelectronics sales office for more details.
9.1
Bad block management
Devices with Bad Blocks have the same quality level and the same AC and DC
characteristics as devices where all the blocks are valid. A Bad Block does not affect the
performance of valid blocks because it is isolated from the bit line and common source line
by a select transistor.
The devices are supplied with all the locations inside valid blocks erased (FFh). The Bad
Block Information is written prior to shipping. Any block, where the 1st Byte in the spare area
of the last page, does not contain FFh, is a Bad Block.
The Bad Block Information must be read before any erase is attempted as the Bad Block
Information may be erased. For the system to be able to recognize the Bad Blocks based on
the original information it is recommended to create a Bad Block table following the
flowchart shown in
Figure 11.
9.2
Block replacement
Over the lifetime of the device additional Bad Blocks may develop. In this case the block has
to be replaced by copying the data to a valid block. These additional Bad Blocks can be
identified as attempts to program or erase them will give errors in the Status Register.
As the failure of a page program operation does not affect the data in other pages in the
same block, the block can be replaced by re-programming the current data and copying the
rest of the replaced block to an available valid block.
Refer to
Table 13
for the recommended procedure to follow if an error occurs during an
operation.
相關(guān)PDF資料
PDF描述
NAND04GA3C2AN6F 4Gbit, 2112 Byte Page, 3V, Multi-level NAND Flash Memory
NAND04GW3C2AN6E 4Gbit, 2112 Byte Page, 3V, Multi-level NAND Flash Memory
NAND128R3A2AZA1 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
NAND128W3A0AV6 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
NAND256R3A0AZB6 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
NAND04GR3B2DDI6 制造商:Micron Technology Inc 功能描述:NAND - Gel-pak, waffle pack, wafer, diced wafer on film
NAND04GR3B2DN6E 功能描述:IC FLASH 4GBIT 48TSOP RoHS:是 類別:集成電路 (IC) >> 存儲器 系列:- 標(biāo)準(zhǔn)包裝:576 系列:- 格式 - 存儲器:閃存 存儲器類型:閃存 - NAND 存儲容量:512M（64M x 8） 速度:- 接口:并聯(lián) 電源電壓:2.7 V ~ 3.6 V 工作溫度:-40°C ~ 85°C 封裝/外殼:48-TFSOP（0.724"，18.40mm 寬） 供應(yīng)商設(shè)備封裝:48-TSOP 包裝:托盤 其它名稱:497-5040
NAND04GR3B2DZL6F 制造商:Micron Technology Inc 功能描述:NAND - Tape and Reel
NAND04GR3B2EN6E 制造商:Micron Technology Inc 功能描述:NAND - Trays
NAND04GR3B2EN6F 制造商:Micron Technology Inc 功能描述:NAND - Tape and Reel
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。

采購需求

(若只采購一條型號，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購。也可以進(jìn)入我的后臺，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購。也可以進(jìn)入我的后臺，查看報(bào)價(jià)

*型號 *數(shù)量 廠商 批號 封裝
添加更多采購

我的聯(lián)系方式

*
*
*