參數(shù)資料
型號(hào): MC92602ZTA
廠商: MOTOROLA INC
元件分類: 微控制器/微處理器
英文描述: SPECIALTY MICROPROCESSOR CIRCUIT, PBGA196
封裝: MAPBGA-196
文件頁(yè)數(shù): 53/98頁(yè)
文件大?。?/td> 896K
代理商: MC92602ZTA
MOTOROLA
Chapter 6. Test Features
6-1
Chapter 6
Test Features
The MC92602, supports several test modes for Built In System Test, BIST, and production
testing. The MC92602 also has an IEEE Std. 1149.1 [4] compliant Test Access Port and
Boundary
Scan Architecture
implementations.
This
chapter
covers
the
JTAG
implementation and the system accessible test modes.
6.1
IEEE Std. 1149.1 Implementation
This section describes the IEEE Std. 1149.1 compliant Test Access Port and Boundary Scan
Architecture implementation in the MC92602.
6.1.1
Test Access Port (TAP) Interface Signals
Table 6-1 lists the interface signals for the TAP.
NOTE
There are 10K Ohm pull-ups on the TMS, TDI and TRST. If
TRST is not held low during power-up or does not receive an
active low reset after power-up, the test logic may assume an
indeterminate state disabling some of the normal transceiver
functions. It is recommended that TRST be terminated in one
of the following ways:
1. TRST be driven by a TAP controller that provides a reset
after power-up.
Table 6-1. TAP Interface Signals
Signal Name
Description
Function
Direction
Active
State
TCK
Test Clock
Test logic clock.
Input
-
TMS
Test Mode Select
TAP mode control input.
Input
-
TDI
Test Data In
Serial test instruction/data input.
Input
-
TRST
Test Reset Bar
Asynchronous test controller reset.
Input
Low
TDO
Test Data Out
Serial test instruction/data output.
Output
-
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