Figure-23 JTAG State" />
參數(shù)資料
型號: IDT82V2082BFG
廠商: IDT, Integrated Device Technology Inc
文件頁數(shù): 66/88頁
文件大小: 0K
描述: IC LIU T1/E1/J1 2CH 81BGA
標(biāo)準(zhǔn)包裝: 360
類型: 線路接口裝置(LIU)
規(guī)程: T1,E1,J1
電源電壓: 3.13 V ~ 3.47 V
安裝類型: 表面貼裝
封裝/外殼: 81-LFBGA
供應(yīng)商設(shè)備封裝: 81-CABGA(8x8)
包裝: 托盤
IDT82V2082
DUAL CHANNEL T1/E1/J1 LONG HAUL/SHORT HAUL LINE INTERFACE UNIT
IEEE STD 1149.1 JTAG TEST ACCESS PORT
69
May 4, 2009
Figure-23 JTAG State Diagram
Exit2-IR
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-IR state.
The test data register selected by the current instruction retains its previous value and the instruction does not change during this state.
Update-IR
The instruction shifted into the instruction register is latched into the parallel output from the shift-register path on the falling edge of TCK.
When the new instruction has been latched, it becomes the current instruction. The test data registers selected by the current instruction retain
their previous value.
Table-58 TAP Controller State Description (Continued)
STATE
DESCRIPTION
Test-logic Reset
Run Test/Idle
Select-DR
Select-IR
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Exit1-DR
Exit1-IR
Pause-DR
Pause-IR
Exit2-DR
Exit2-IR
Update-DR
Update-IR
1
0
1
00
0
1
0
1
0
1
0
1
0
1
0
1
0
1
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