2002 Teccor Electronics
Thyristor Product Catalog
AN1001 - 1
http://www.teccor.com
+1 972-580-7777
AN1001
Fundamental Characteristics of Thyristors
Introduction
The thyristor family of semiconductors consists of several very
useful devices. The most widely used of this family are silicon
controlled rectifiers (SCRs), triacs, sidacs, and diacs. In many
applications these devices perform key functions and are real
assets in meeting environmental, speed, and reliability specifica-
tions which their electro-mechanical counterparts cannot fulfill.
This application note presents the basic fundamentals of SCR,
triac, sidac, and diac thyristors so the user understands how they
differ in characteristics and parameters from their electro-
mechanical counterparts. Also, thyristor terminology is defined.
SCR
Basic Operation
Figure AN1001.1 shows the simple block construction of an SCR.
Figure AN1001.1
SCR Block Construction
The operation of a PNPN device can best be visualized as a spe-
cially coupled pair of transistors as shown in Figure AN1001.2.
Figure AN1001.2
Coupled Pair of Transistors as a SCR
The connections between the two transistors trigger the occur-
rence of regenerative action when a proper gate signal is applied
to the base of the NPN transistor. Normal leakage current is so
low that the combined h
of the specially coupled two-transistor
feedback amplifier is less than unity, thus keeping the circuit in
an off-state condition. A momentary positive pulse applied to the
gate biases the NPN transistor into conduction which, in turn,
biases the PNP transistor into conduction. The effective h
FE
momentarily becomes greater than unity so that the specially
coupled transistors saturate. Once saturated, current through the
transistors is enough to keep the combined h
FE
greater than
unity. The circuit remains “on” until it is “turned off” by reducing
the anode-to-cathode current (I
) so that the combined h
is less
than unity and regeneration ceases. This threshold anode current
is the holding current of the SCR.
Geometric Construction
Figure AN1001.3 shows cross-sectional views of an SCR chip
and illustrations of current flow and junction biasing in both the
blocking and triggering modes.
Figure AN1001.3
Cross-sectional View of SCR Chip
Gate
Gate
J1
J2
J3
P
N
P
N
Schematic Symbol
Block Construction
Cathode
Anode
Cathode
Anode
N
P
N
P
N
P
Gate
Cathode
J1
J2
J2
J3
Anode
N
N
N
Cathode
Gate
Anode
Load
P
P
Two-transistor
Schematic
Two-transistor Block
Construction Equivalent
Gate
(+)
Cathode
(-)
IGT
P
N
N
P
(+)
(+)
Anode
IT
Forward Bias and Current Flow
Gate
Cathode
P
N
N
P
(-)
Anode
Reverse Bias
Reverse Biased
Junction
(-)
Anode
Equivalent Diode
Relationship
Forward
Blocking
Junction
Cathode
(-)
(+)
Anode
Equivalent Diode
Relationship
Cathode
(+)
Reverse Biased
Gate Junction
AN1001