
2004 Apr 01
9
Philips Semiconductors
Product specication
XGA analog input at panel controller
SAA6703AH
VSSD(IC8)
122
internal digital core supply ground 8
VDDD(IC8)
123
internal digital core supply voltage 8 (2.5 V)
VSSD(EP8)
124
external digital pad supply ground 8
VDDD(EP8)
125
external digital pad supply voltage 8 (3.3 V)
CSG3
126
O
control signal generator 3 output
CSG4/A1
127
I/O
control signal generator 4 output (CSG4) or I2C-bus slave address input, latched
via hardware reset (A1)
RESERVED4
128
reserved for future use
RESERVED5
129
reserved for future use
RESERVED6
130
reserved for future use
VSSD(EP9)
131
external digital pad supply ground 9
VDDD(EP9)
132
external digital pad supply voltage 9 (3.3 V)
RESERVED7
133
reserved for future use
RESERVED8
134
reserved for future use
VCLK
135
I/O
sample clock input or output; congurable as output if generated internally
n.c.
136
do not connect
n.c.
137
do not connect
OUTEN
138
O
output enable status output
PWM
139
O
pulse width modulation for control of backlight brightness output
VSYNC
140
I/O
vertical sync input or output; congurable as output if decoded from composite
sync
HSYNC
141
I
horizontal and composite sync input
VSSD(EP10)
142
external digital pad supply ground 10
VDDD(EP10)
143
external digital pad supply voltage 10 (3.3 V)
VSSD(IC9)
144
internal digital core supply ground 9
VDDD(IC9)
145
internal digital core supply voltage 9 (2.5 V)
VSS(PLL)(P)
146
supply ground for panel clock phase locked loop
VDD(PLL)(P)
147
supply voltage for panel clock phase locked loop (2.5 V)
n.c.
148
do not connect
VSSA(PLL)(S)
149
analog supply ground for sample clock phase locked loop
VDDA(PLL)(S)
150
analog supply voltage for sample clock phase locked loop (2.5 V)
VSSD(PLL)(S)
151
digital supply ground for sample clock phase locked loop
VDDD(PLL)(S)
152
digital supply voltage for sample clock phase locked loop (2.5 V)
TRST
153
I
test reset input for boundary scan test (active LOW); note
2TCK
154
I
test clock input for boundary scan test; note
2TDI
155
I
test data input for boundary scan test; note
2TMS
156
I
test mode select input for boundary scan test or scan test; note
2TDO
157
O
test data output for boundary scan test
SYMBOL
PIN(1)
TYPE
DESCRIPTION