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| 型號： | PM5352-B1 |
| 英文描述： | Interface IC |
| 中文描述： | 接口IC |
| 文件頁數(shù)： | 40/77頁 |
| 文件大?。?/td> | 901K |
| 代理商： | PM5352-B1 |
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PM5352 S/UNI STAR
DATA SHEET
PMC-1990421
ISSUE 2
SATURN USER NETWORK INTERFACE 155 (STAR)
PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE
36
Pin Name
Type
Pin
No.
Function
INTB
Output
Open-
drain
C10
The active-low interrupt (INTB) signal goes low
when a S/UNI-STAR interrupt source is active and
that source is unmasked. The S/UNI-STAR may be
enabled to report many alarms or events via
interrupts.
Examples of interrupt sources are loss of signal
(LOS), loss of frame (LOF), line AIS, line remote
defect indication (LRDI) detect, loss of pointer
(LOP), path AIS, path remote defect indication
detect and others.
INTB is tristated when the interrupt is
acknowledged via an appropriate register access.
INTB is an open drain output.
6.5 JTAG Test Access Port (TAP) Signals
Pin Name
Type
Pin
No.
Function
TCK
Input
B8
The test clock (TCK) signal provides timing for test
operations that are carried out using the IEEE
P1149.1 test access port.
TMS
Input
pull-up
B9
The test mode select (TMS) signal controls the test
operations that are carried out using the IEEE
P1149.1 test access port. TMS is sampled on the
rising edge of TCK. TMS has an integral pull-up
resistor.
TDI
Input
pull-up
D10
The test data input (TDI) signal carries test data into
the S/UNI-STAR via the IEEE P1149.1 test access
port. TDI is sampled on the rising edge of TCK.
TDI has an integral pull-up resistor.
TDO
Tristate
A9
The test data output (TDO) signal carries test data
out of the S/UNI-STAR via the IEEE P1149.1 test
access port. TDO is updated on the falling edge of
TCK. TDO is a tristate output which is inactive
except when scanning of data is in progress.
This Material Copyrighted by Its Respective Manufacturer
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