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| 型號： | MC92602ZTA |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PBGA196 |
| 封裝： | 15 X 15 MM, 1.60 MM HEIGHT, 1 MM PITCH, MAPBGA-196 |
| 文件頁數(shù)： | 57/102頁 |
| 文件大小： | 1581K |
| 代理商： | MC92602ZTA |
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6-4
MC92602 SerDes Reference Manual
MOTOROLA
System Accessible Test Modes
6.2
System Accessible Test Modes
System accessible test modes are selected through the TST_0, TST_1, and LBE signals.
Table 6-4 shows test mode state selection.
6.2.1
Loopback System Test
The MC92602 can be configured in loopback mode where the transmitted data is looped
back to its receiver independent of the receiver’s link inputs. This is enabled by setting
loopback enable, LBE, high. The characters transmitted are controlled by the normal
transmitter controls. If the transceiver is working properly, the data/control characters
transmitted are received by the receiver. This allows system logic to use various data
sequences to test the operation of the transceiver.
The loopback signals are electrically isolated from the XLINK_x_P or XLINK_x_N output
signals. Therefore, if the outputs are shorted, or otherwise restricted, the loopback signals
still operate normally. When in loopback mode, the loopback output enable signal, LBOE,
controls the action of the link output signals. When LBOE is low, the XLINK_x_P or
XLINK_x_N output signals are disabled and are high impedance. When LBOE is high, the
link output signals continue to operate normally.
The receiver’s link input signals, RLINK_x_P and RLINK_x_N, are electrically isolated
during loopback mode, such that their state does not affect the loopback path.
6.2.2
BIST Sequence System Test Mode
The MC92602 transmitter has an integrated, 23rd order, pseudo-noise (PN) pattern
generator. Stimulus from this generator may be used for system testing. The receiver has a
23rd order signature analyzer that is synchronized to the incoming PN stream and may be
used to count character mismatch errors relative to the internal PN reference pattern.
Table 6-4. Test Mode State Selection
TST_1
TST_0
LBE
Description
Low
Normal operation. No test mode enabled.
Low
High
Loopback system test mode
Low
High
Low
BIST sequence system test mode with IDLEs inserted for rate adaption.
Low
High
Loopback BIST sequence system test mode
High
Low
BIST sequence system test mode without IDLEs inserted for rate adaption.
High
Low
High
Reserved
High
Low
Reserved
High
Reserved
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