參數(shù)資料
型號: E28F004BX-T120
廠商: INTEL CORP
元件分類: PROM
英文描述: OSC 5V SMT PLAS 14X9 CMOS
中文描述: 512K X 8 FLASH 12V PROM, 120 ns, PDSO40
封裝: 20 X 10 MM, TSOP-40
文件頁數(shù): 28/50頁
文件大?。?/td> 449K
代理商: E28F004BX-T120
28F400BX-TB 28F004BX-TB
DC CHARACTERISTICS EXTENDED TEMPERATURE OPERATION (Continued)
Symbol
Parameter
Notes
Min
Typ Max Unit
Test Conditions
VOH2
Output High Voltage (CMOS)
085 VCC
VVCC e VCC Min
IOH eb25 mA
VCC b 04
VCC e VCC Min
IOH eb100 mA
VPPL
VPP during Normal Operations
3
00
65
V
VPPH
VPP during EraseWrite Operations
7
114
120 126
V
VPPH
VPP during EraseWrite Operations
8
108
120 132
V
VLKO
VCC EraseWrite Lock Voltage
20
V
VHH
RP
Unlock Voltage
115
130
V
Boot Block WriteErase
NOTES
1 All currents are in RMS unless otherwise noted Typical values at VCC e 50V VPP e 120V T e 25 C These currents
are valid for all product versions (packages and speeds)
2 ICCES is specified with the device deselected If the device is read while in Erase Suspend Mode current draw is the sum
of ICCES and ICCR
3 Block Erases and WordByte Writes are inhibited when VPP e VPPL and not guaranteed in the range between VPPH and
VPPL
4 Sampled not 100% tested
5 Automatic Power Savings (APS) reduces ICCR to less than 1 mA typical in static operation
6 CMOS Inputs are either VCC g02V or GND g02V TTL Inputs are either VIL or VIH
7 VPP e 120V g 5% for applications requiring 100000 block erase cycles
8 VPP e 120V g 10% for applications requiring wider VPP tolerances at 100 block erase cycles
9 For the 28F004BX address pin A10 follows the COUT capacitance numbers
10 ICCR typical is 20 mA for X16 Active Read Current
CAPACITANCE(1) TA e 25 C f e 1 MHz
Symbol
Parameter
Typ
Max
Unit
Conditions
CIN
Input Capacitance
6
8
pF
VIN e 0V
COUT
Output Capacitance
10
12
pF
VOUT e 0V
NOTE
1 Sampled not 100% tested
34
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