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參數(shù)資料
| 型號： | AND8090D |
| 廠商： | ON SEMICONDUCTOR |
| 英文描述： | AC Characteristics of ECL Devices |
| 中文描述： | 交流特性的ECL裝置 |
| 文件頁數(shù)： | 4/20頁 |
| 文件大?。?/td> | 896K |
| 代理商： | AND8090D |
AND8090/D
http://onsemi.com
4
AC Test Boards
Each test device is mounted on a controlled impedance
test board that is specifically designed to measure AC
characteristics. Test boards typically have multiple layers.
An example of an AC characteristic test board is shown in
Figures 2 through 4. This particular test board is used to test
ECLinPS Lite
SOIC8 devices.
Figure 2. Top Photo of the AC Test Board
Figure 3. Top Schematic of the AC Test Board
Figure 4. Bottom Schematic of the AC Test Board
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