參數(shù)資料
型號(hào): AND8090D
廠商: ON SEMICONDUCTOR
英文描述: AC Characteristics of ECL Devices
中文描述: 交流特性的ECL裝置
文件頁數(shù): 17/20頁
文件大?。?/td> 896K
代理商: AND8090D
AND8090/D
http://onsemi.com
17
Deterministic Jitter
Deterministic jitter (DJ, also referred to as “data” or
“systematic” jitter) is characterized by bounded
non–Gaussian probability density functions. Deterministic
jitter includes Duty Cycle Distortion (DCD) which is
specified as Duty Cycle Skew or Pulse Skew on data sheets
(refer to the “Duty Cycle Skew” section). Determistic jitter
is defined for a specific test pattern, and is specified as a
peaktopeak value.
Total DJ Test Setup
The total DJ test setup shown in Figure 40 is used to
produce an eye diagram. An eye diagram is useful as it
provides a qualitative view of peaktopeak deterministic
jitter. To form an eye diagram, a PRBS (PseudoRandom Bit
Sequence) signal is sent to the DUT input, and the DUT
output (the eye diagram) is observed on the oscilloscope.
The NBSG14 eye diagram in Figure 41 was created by an
Advantest D3186 generating a 2
31
1 PRBS data pattern at
10.8 Gbps. The Tektronix TDS8000 oscilloscope with an
80E01 50 GHz sampling module acquired 7000 samples.
The total deterministic jitter represented by the histogram at
the top left of the eye diagram is 18.00 ps peaktopeak. As
deterministic jitter increases, the eye closes (i.e., the eye
width decreases) which increases the probability of a data
transmission error.
Figure 40. Total Deterministic Jitter Test
Oscilloscope (DJ)
Total Jitter(DJ)
Pattern Generator (DJ)
DUT (DJ)
PRBS
Trigger
Pattern Generator
Oscilloscope
DJ (PP)
PRBS
DUT
Figure 41. Total Deterministic Jitter Eye Diagram
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