![](http://datasheet.mmic.net.cn/Texas-Instruments/ADS62C17IRGC25_datasheet_100781/ADS62C17IRGC25_5.png)
ELECTRICAL CHARACTERISTICS
(1)
www.ti.com ............................................................................................................................................................. SLAS631A – APRIL 2009 – REVISED JULY 2009
Typical values are at 25°C, AVDD = 3.3V, DRVDD = 1.8V, sampling frequency = 200 MSPS, 50% clock duty cycle, –1dBFS
differential analog input, internal reference mode, LVDS and CMOS interfaces unless otherwise noted.
Min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 3.3V, DRVDD = 1.8V
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
11
bits
ANALOG INPUTS
Differential input voltage range
2.0
VPP
Differential input resistance (at dc)
> 1
M
Differential input capacitance
3.5
pF
Analog input bandwidth
700
MHz
Analog input common mode current (per channel)
3.6
A/MSPS
VCM common mode voltage output
1.5
V
VCM output current capability
±4
mA
POWER SUPPLY
IAVDD
Analog supply current
262
mA
IDRVDD
Output buffer supply current LVDS interface
With 100
external
120
mA
termination
IDRVDD
Output buffer supply current CMOS interface
No external load
87
mA
capacitance
Analog power
865
1025
mW
Digital power LVDS interface
216
306
mW
Global power down
45
75
mW
No missing codes
Assured
DC ACCURACY
DNL
Differential Non-Linearity
Fin = 170 MHz
-0.6
±0.2
0.6
LSB
INL
Integral Non-Linearity
Fin = 170 MHz
-2.5
±0.75
2.5
LSB
Offset Error
-20
±2
20
mV
Offset error temperature coefficient
0.02
mV/C
Offset error variation with supply
0.5
mV/V
There are two sources of gain error – internal reference inaccuracy and channel gain error
Gain error due to internal reference inaccuracy alone
-1
±0.2
1
% FS
Gain error of channel alone(2)
-1
+0.2
1
% FS
Channel gain error temperature coefficient
0.002
Δ%/°C
Difference in gain errors
between two channels
-2
2
within the same device
Gain matching(3)
% FS
Difference in gain errors
between two channels
-4
4
across two devices
(1)
In CMOS interface, the DRVDD current scales with the sampling frequency and the load capacitance on output pins.
(2)
This is specified by design and characterization; it is not tested in production.
(3)
For two channels within the same device, only the channel gain error matters, as the reference is common for both channels.
Copyright 2009, Texas Instruments Incorporated
5