參數(shù)資料
型號: XRM48L950ZWTT
廠商: Texas Instruments
文件頁數(shù): 136/176頁
文件大?。?/td> 0K
描述: MCU 16/32Bit FLASH 3MB 337NFBGA
標準包裝: 1
系列: Hercules™ ARM® RM4x
應用: 工業(yè)安全,醫(yī)療
核心處理器: ARM? Cortex? - R4F
程序存儲器類型: 閃存(3MB)
控制器系列: RM4
RAM 容量: 256K x 8
接口: CAN,以太網(wǎng),I²C,LIN,MibSPI,SCI,SPI,USB
輸入/輸出數(shù): 120
電源電壓: 1.14 V ~ 3.6 V
工作溫度: -40°C ~ 105°C
安裝類型: 表面貼裝
封裝/外殼: 337-LFBGA
包裝: 托盤
供應商設備封裝: 337-NFBGA(16x16)
其它名稱: 296-29390
SPNS174A – APRIL 2012 – REVISED SEPTEMBER 2013
4.5.6.1
Application Sequence for CPU Self-Test
1. Configure clock domain frequencies.
2. Select number of test intervals to be run.
3. Configure the timeout period for the self-test run.
4. Enable self-test.
5. Wait for CPU reset.
6. In the reset handler, read CPU self-test status to identify any failures.
7. Retrieve CPU state if required.
For more information see the device specific technical reference manual.
4.5.6.2
CPU Self-Test Clock Configuration
The maximum clock rate for the self-test is 100MHz. The STCCLK is divided down from the CPU clock.
This divider is configured by the STCCLKDIV register at address 0xFFFFE108.
For more information see the device specific technical reference manual.
4.5.6.3
CPU Self-Test Coverage
Table 4-7 shows CPU test coverage achieved for each self-test interval. It also lists the cumulative test
cycles. The test time can be calculated by multiplying the number of test cycles with the STC clock period.
Table 4-7. CPU Self-Test Coverage
INTERVALS
TEST COVERAGE, %
TEST CYCLES
0
1
62.13
1365
2
70.09
2730
3
74.49
4095
4
77.28
5460
5
79.28
6825
6
80.90
8190
7
82.02
9555
8
83.10
10920
9
84.08
12285
10
84.87
13650
11
85.59
15015
12
86.11
16380
13
86.67
17745
14
87.16
19110
15
87.61
20475
16
87.98
21840
17
88.38
23205
18
88.69
24570
19
88.98
25935
20
89.28
27300
21
89.50
28665
22
89.76
30030
23
90.01
31395
24
90.21
32760
62
System Information and Electrical Specifications
Copyright 2012–2013, Texas Instruments Incorporated
Product Folder Links: RM48L950 RM48L750 RM48L550
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