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參數(shù)資料
| 型號： | TNETA1556 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 155.52-Mbit/S Clock-Recovery Device(155.52-MBIT/S時鐘恢復裝置) |
| 中文描述： | 155.52 - Mbit / s的時鐘恢復裝置（155.52 - Mbit / s的時鐘恢復裝置） |
| 文件頁數(shù)： | 2/10頁 |
| 文件大小： | 216K |
| 代理商： | TNETA1556 |
TNETA1556
155.52-MBIT/S CLOCK-RECOVERY DEVICE
SDNS015C – FEBRUARY 1994 – REVISED JUNE 1995
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME
NO.
CLK, CLK
20, 21
O
Recovered clock. ECL compatible.
Capacitor connection for phase-lock-loop filter (CPLL = 0.1
μ
F recommended)
Pseudo-ECL-compatible input for pseudo-ECL-to-ECL converter
CPLL
2
I
DATAIN, DATAIN,
14, 15
I
DATAOUT, DATAOUT
12, 13
O
ECL-compatible output for pseudo-ECL converter
DIN, DIN
4, 6
I
Serial data input. ECL or pseudo-ECL compatible.
DOUT, DOUT
18, 17
O
Serial data output. ECL compatible.
GND
3, 8, 10, 19
Ground (0-V reference)
INDIS
5
I
Input disable (TTL compatible). The device ignores the input data when INDIS is active and
forces DOUT low and DOUT high.
TESTOUT
9
O
Manufacturing test output. Leave open.
TEST2
23
I
Manufacturing test input. Tie to GND.
TEST1
24
I
Manufacturing test input. Tie to GND.
VCC
1, 7, 11, 16, 22
Supply voltage
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
(see Note 1)
Input voltage range: TTL
–0.5 V to 7 V
–1.2 V to 7 V
–2.5 V to 0
0 V to 7 V
–40
°
C to 85
°
C
–65
°
C to 150
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PECL
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to GND.
ECL
recommended operating conditions
MIN
NOM
MAX
UNIT
VCC
Supply voltage
4.75
5
5.25
V
VIH
Hi h l
High-level input voltage
TTL
2
V
PECL (see Note 2)
VCC–1.1
–1.1
VCC–0.8
–0.8
ECL
VIL
Low-level input voltage
TTL
0.8
V
PECL (see Note 2)
VCC–1.9
–1.9
VCC–1.5
–1.5
ECL
IIK
TA
NOTE 2: The algebraic convention, in which the least positive (most negative) value is designated minimum, is used in this data sheet for
logic-level voltages only.
Input clamp current, TTL
–18
mA
°
C
Operating free-air temperature
–40
85
P
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